BS EN 61643-341:2001
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Low voltage surge protective devices Specification for thyristor surge suppressors (TSS)
Hardcopy , PDF
07-10-2020
English
03-15-2002
Committee |
PEL/37
|
DevelopmentNote |
Supersedes 01/203912 DC (05/2002)
|
DocumentType |
Standard
|
Pages |
68
|
PublisherName |
British Standards Institution
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
Is a test specification standard for thyristor surge suppressor (TSS) components designed to limit overvoltages and divert surge currents by clipping and crowbarring actions. Such components are used in the construction of surge protective devices, particularly as they apply to telecommunications. This standard contains information on -terms, letter symbols, and definitions -basic functions, configurations and component structure -service conditions and fault modes -rating verification and characteristic measurement.
Standards | Relationship |
NF EN 61643-341 : 2002 | Identical |
IEC 61643-341:2001 | Identical |
NBN EN 61643-341 : 2003 | Identical |
I.S. EN 61643-341:2002 | Identical |
DIN EN 61643-341 : 2002 | Identical |
UNE-EN 61643-341:2003 | Identical |
EN 61643-341:2001 | Identical |
IEC 60050-702:1992 | International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices |
IEC 60721-3-9:1993 | Classification of environmental conditions - Part 3: Classification of groups of environmental parameters and their severities - Section 9: Microclimates inside products |
IEC 60099-4:2014 | Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems |
EN 60721-3-9:1993/A1:1995 | CLASSIFICATION OF ENVIRONMENTAL CONDITIONS - PART 3: CLASSIFICATION OF GROUPS OF ENVIRONMENTAL PARAMETERS AND THEIR SEVERITIES - SECTION 9: MICROCLIMATES INSIDE PRODUCTS |
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IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
IEC 60721-3-3:1994+AMD1:1995+AMD2:1996 CSV | Classification of environmental conditions - Part 3-3: Classification of groups of environmental parameters and their severities - Stationary use at weatherprotected locations |
IEC 60747-6:2016 | Semiconductor devices - Part 6: Discrete devices - Thyristors |
IEC 61083-1:2001 | Instruments and software used for measurement in high-voltage impulse tests - Part 1: Requirements for instruments |
IEC 60747-2:2016 | Semiconductor devices - Part 2: Discrete devices - Rectifier diodes |
EN 60721-3-3 : 95 AMD 2 97 | CLASSIFICATION OF ENVIRONMENTAL CONDITIONS - CLASSIFICATION OF GROUPS OF ENVIRONMENTAL PARAMETERS AND THEIR SEVERITIES - STATIONARY USE AT WEATHER-PROTECTED LOCATIONS |
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