BS EN 61164:2004

1 Scope
2 Normative references
3 Terms and definitions
4 Symbols
5 Reliability growth models in design and test
6 Reliability growth models used for systems/products in
  design phase
  6.1 Modified power law model for planning of reliability
      growth in product design phase
      6.1.1 General
      6.1.2 Planning model for the reliability growth during
            the product design period
      6.1.3 Tracking the achieved reliability growth
  6.2 Modified Bayesian IBM-Rosner model for planning
      reliability growth in design phase
      6.2.1 General
      6.2.2 Data requirements
      6.2.3 Estimates of reliability growth and related
            parameters
      6.2.4 Tracking reliability growth during design phase
7 Reliability growth planning a tracking in the product
  reliability growth testing
  7.1 Continuous reliability growth models
      7.1.1 The power law model
      7.1.2 The fixed number of faults model
  7.2 Discrete reliability growth model
      7.2.1 Model description
      7.2.2 Estimation
8 Use of the power law model in planning reliability improvement
  test programmes
9 Statistical test and estimation procedures for continuous
  power law model
  9.1 Overview
  9.2 Growth tests and parameter estimation
      9.2.1 Case 1 - Time data for every relevant failure
      9.2.2 Case 2 - Time data for groups of relevant failures
  9.3 Goodness-of-fit tests
      9.3.1 General
      9.3.2 Case 1 - Time data for every relevant failure
      9.3.3 Case 2 - Time data for groups of relevant failures
  9.4 Confidence intervals on the shape parameter
      9.4.1 General
      9.4.2 Case 1 - Time data for every relevant failure
      9.4.3 Case 2 - Time data for groups of relevant failures
  9.5 Confidence intervals on current MTBF
      9.5.1 General
      9.5.2 Case 1 - Time data for every relevant failure
      9.5.3 Case 2 - Time data for groups of relevant failures
  9.6 Projection technique
Annex A (informative) Examples for planning and analytical
                      models used in design and test phase of
                      product development
  A.1 Reliability growth planning in product design phase
      A.1.1 Power law planning model example
      A.1.2 Construction of the model and monitoring of
            reliability growth
  A.2 Example of Bayesian reliability growth model for the
      product design phase
  A.3 Failure data for discrete trials
  A.4 Examples of reliability growth through testing
      A.4.1 Introduction
      A.4.2 Current reliability assessments
      A.4.3 Projected reliability estimates
Annex B (informative) The power law reliability growth
                      model - Background information
  B.1 The Duane postulate
  B.2 The power law model
  B.3 Modified power law model for planning of reliability
      growth in product design phase
  B.4 Modified Bayesian IBM-Rosner model for planning
      reliability growth in the design phase
Annex ZA (normative) Normative references to international
                     publications with their corresponding
                     European publications

Provides models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests.

IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:
- addition of two statistical models for reliability growth planning and tracking in the product design phase;
- statistical methods for the reliability growth programme in the design phase of IEC 61014;
- addition of the discrete reliability growth model for the test phase;
- addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;
- addition of real lif examples for most of the statistical models;
- numerical correction of tables in the reliability growth test example.

This publication is to be read in conjunction with IEC 61014:2003.