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BS EN 60255-11:2010

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Measuring relays and protection equipment Voltage dips, short interruptions, variations and ripple on auxiliary power supply port

Available format(s)

Hardcopy , PDF

Superseded date

07-31-2014

Superseded by

BS EN 60255-26:2013

Language(s)

English

Published date

02-28-2010

US$184.93
Excluding Tax where applicable

1 Scope and object
2 Normative references
3 Terms and definitions
4 Requirements
5 Test equipment
6 Test set-up
7 Test procedure
8 Criteria for acceptance
9 Test report
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Defines the general requirements for a.c. and d.c. power supplies, for measuring relays and protection equipment for power system protection, including the control, monitoring and process interface equipment used with those systems.

Committee
PEL/95
DevelopmentNote
Supersedes 07/30166308 DC. (02/2010)
DocumentType
Standard
Pages
16
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

This part of the IEC 60255 series specifies the general requirements for a.c. and d.c. power supplies, for measuring relays and protection equipment for power system protection, including the control, monitoring and process interface equipment used with those systems. This part is based on:

  • IEC 61000-4-11 for a.c. voltage dips, short interruptions and variations;

  • IEC 61000-4-17 for voltage ripple;

  • IEC 61000-4-29 for d.c. voltage dips, short interruptions and variations.

The objective of the tests is to confirm that the equipment under test will operate correctly when energised and subjected to dips, interruptions and alternating components (ripple).

The requirements specified in this standard are applicable to measuring relays and protection equipment in a new condition and all tests specified are type tests only.

The object of this standard is to state:

  • definitions of terms used;

  • test severity levels;

  • test equipment;

  • test set-up;

  • test procedure;

  • criteria for acceptance;

  • test report.

Standards Relationship
EN 60255-11:2010 Identical
IEC 60255-11:2008 Identical

SEMI F47 : 2006(R2012) SPECIFICATION FOR SEMICONDUCTOR PROCESSING EQUIPMENT VOLTAGE SAG IMMUNITY
EN 61000-4-11:2004/A1:2017 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-11: TESTING AND MEASUREMENT TECHNIQUES - VOLTAGE DIPS, SHORT INTERRUPTIONS AND VOLTAGE VARIATIONS IMMUNITY TESTS (IEC 61000-4-11:2004/A1:2017)
IEC 61000-6-2:2016 Electromagnetic compatibility (EMC) - Part 6-2: Generic standards - Immunity standard for industrial environments
IEC 60050-151:2001 International Electrotechnical Vocabulary (IEV) - Part 151: Electrical and magnetic devices
IEC 61000-4-11:2004+AMD1:2017 CSV Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
IEC 61000-4-17:1999+AMD1:2001+AMD2:2008 CSV Electromagnetic compatibility (EMC) - Part 4-17: Testing and measurement techniques - Ripple on d.c. input power port immunity test
EN 60255-6 : 94 AC 95 ELECTRICAL RELAYS - MEASURING RELAYS AND PROTECTION EQUIPMENT
EN 61000-6-2:2005/corrigendum:2005 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 6-2: GENERIC STANDARDS - IMMUNITY FOR INDUSTRIAL ENVIRONMENTS (IEC 61000-6-2:2005)
IEC 60255-6:1988 Electrical relays - Part 6: Measuring relays and protection equipment
IEC 61000-4-29:2000 Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
EN 61000-4-17:1999/A2:2009 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-17: TESTING AND MEASUREMENT TECHNIQUES - RIPPLE ON D.C. INPUT POWER PORT IMMUNITY TEST
EN 61000-4-29:2000 Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

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