BS CECC50001(1981) : 1981 AMD 7590
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: GENERAL PURPOSE SEMICONDUCTOR DIODES
Superseded date
02-15-1993
Superseded by
Published date
12-06-2012
Publisher
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Gives ratings, characteristics and inspection requirements to be included as mandatory requirements in accordance with BS CECC 50000 in any detail specification for these devices. BS AMD 7590 renumbers this standard to BS EN 150001
| Committee |
ECL/24
|
| DevelopmentNote |
Renumbered and superseded by BS EN 150001. Supersedes BS E9371(1975). (09/2005)
|
| DocumentType |
Standard
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| CECC 50001 : 1980 | Identical |
| BS EN 150007:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for high frequency amplification |
| BS EN 150003:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for low frequency amplification |
| BS EN 150004:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: bipolar transistors for switching applications |
| BS EN 150006:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Variable capacitance diode(s) |
| BS E9375:1975 | Specification. Harmonized system of quality assessment for electronic components. Blank detail specification: voltage regulator diodes and voltage reference diodes excluding precision-voltage temperature-compensated reference diodes |
| BS E9372:1976 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated bipolar transistors for low and high frequency amplification |
| IEC 60191-2:2012 DB | Mechanical standardization of semiconductor devices - Part 2: Dimensions |
| CECC 50000 : 86 AMD 3 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION FOR DISCRETE SEMICONDUCTOR DEVICES |
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