BS CECC14000(1984) : 1984 AMD 7575
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: PHOTOMULTIPLIER TUBES
Superseded date
02-15-1993
Superseded by
Published date
12-06-2012
Publisher
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Applies to photomultiplier tubes of assessed quality. BS AMD 7575 renumbers this standard to BS EN 114000
Committee |
ECL/5
|
DevelopmentNote |
Renumbered and superseded by BS EN 114000. Supersedes 80/29001 DC. (08/2005)
|
DocumentType |
Standard
|
PublisherName |
British Standards Institution
|
Status |
Superseded
|
SupersededBy |
Standards | Relationship |
CECC 14000 : 1984 | Identical |
IEC 60306-4:1971 | Similar to |
IEC 60462:2010 | Nuclear instrumentation - Photomultiplier tubes for scintillation counting - Test procedures |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
CECC 00100 : 1988 | BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V |
IEC 60151-15:1967 | Measurements of the electrical properties of electronic tubes and valves. Part 15: Methods of measurement of spurious and unwanted electrode currents |
IEC 60306-4:1971 | Measurement of photosensitive devices. Part 4: Methods of measurement for photo-multipliers |
IEC 60151-1:1963 | Measurements of the electrical properties of electronic tubes and valves - Part 1: Measurement of electrode current |
IEC 60027-1:1992 | Letters symbols to be used in electrical technology - Part 1: General |
IEC 60306-1:1969 | Measurement of photosensitive devices - Part 1: Basic recommendations |
IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
IEC 60067:1966 | Dimensions of electronic tubes and valves |
CECC 00007 : 1978 | BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES |
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