BS CECC 63000:1990
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits
Hardcopy , PDF
English
12-31-1990
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Foreword
Preface
Section 1 - Scope
Section 2 - General
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Standard and preferred values
2.5 Marking
Section 3 - Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Manufacturing stages and sub-contracting
3.3 Manufacturer's approval
3.4 Approval of Film and Hybrid Integrated Circuits
(F&HICs)
3.5 Qualification approval
3.6 Capability approval
3.7 Certified test records
3.8 Delayed deliveries
3.9 Delivery of F&HICs subjected to destructive or
non destructive tests
3.10 Supplementary procedure for deliveries
3.11 Supplementary information
Section 4 - Test and measurement procedures
4.1 General
4.2 Standard conditions for testing
4.3 Visual examination
4.4 Electrical measurement procedures
4.5 Environmental testing procedures
4.6 Screening
Annex A - Internal visual examination
Defines procedures and methods for testing and states requirements for the release of products using either qualification approval or capability approval procedures.
| Committee |
EPL/47
|
| DevelopmentNote |
Inactive for the new design. Supersedes BS CECC63000(1985), 85/30968 DC, 85/30991 DC and 87/23094 DC (01/2006)
|
| DocumentType |
Standard
|
| Pages |
60
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Standards | Relationship |
| CECC 63000 : 84 AMD 5 | Identical |
| CECC 64000 : 1988 | GENERIC SPECIFICATION: FILM RESISTOR NETWORKS |
| BS 5555:1993 | Specification for SI units and recommendations for the use of their multiples and of certain other units |
| IEC 60147-1:1972 | Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics |
| CECC 00109 : 1974 | CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS |
| CECC 00107(PT3) : 80 AMD 1 | CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - PROCEDURE FOR CAPABILITY APPROVAL |
| IEC 60191-1:2007 | Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices |
| IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
| BS 2011-2.1B:1977 | Environmental testing. Tests Tests B. Dry Heat |
| BS 9000-2(1996) : 1996 | GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM |
| BS E9007:1975 | Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes |
| CECC 00100 : 1988 | BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V |
| BS 2011-2.1XA(1981) : 1981 AMD 7553 | ENVIRONMENTAL TESTING - TESTS - TEST XA AND GUIDANCE - IMMERSION IN CLEANING SOLVENTS |
| IEC 60027-1:1992 | Letters symbols to be used in electrical technology - Part 1: General |
| BS 2011-2.1N:1985 | Environmental testing. Tests Test N. Change of temperature |
| BS 2011-2.1Ca:1977 | Environmental testing. Tests Test Ca. Damp heat, steady state |
| CECC 00110 : 1994 | RULE OF PROCEDURE 10 - NATIONAL IMPLEMENTATION OF CECC PRODUCED EUROPEAN STANDARDS AND SPECIFICATIONS |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| BS 4727(1971) : LATEST | |
| CECC 00107(PT2) : 79 AMD 1 | CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - PROCEDURE FOR ENHANCED ASSESSMENT OF QUALITY |
| IEC 60147-0B:1969 | Supplement B - Essential ratings and characteristics et semiconductor devices and general principles of measuring methods - Part 0: General and terminology |
| CECC 00107(PT1) : 1982 | CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - QUALITY ASSESSMENT PROCEDURE FOR GENERAL USAGE |
| IEC TR 60440:1973 | Method of measurement of non-linearity in resistors |
| CECC 00111 : 80 AMD 3 | CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY |
| BS 2011-2.1Ka:1982 | Environmental testing. Tests Test Ka.Salt mist |
| IEC 60147-0:1966 | Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 0: General and terminology |
| IEC 60148A:1974 | First supplement - Letter symbols for semiconductor devices and integrated microcircuits |
| BS 3934:1965 | Specification for dimensions of semiconductor devices and integrated electronic circuits |
| IEC 60148:1969 | Letter symbols for semiconductor devices and integrated microcircuits |
| IEC 60147-0D:1974 | Supplement D - Essential ratings and characteristics et semiconductor devices and general principles of measuring methods -Part 0: General and terminology |
| CECC 00108 : 94 AC 98 | RULE OF PROCEDURE 8 (ATTESTATION OF CONFORMITY) - PART 1: THE CECC MARK AND CONDITIONS OF USE - PART 2: CERTIFICATES OF APPROVAL - PART 3: PROCEDURES FOR THE ATTESTATION OF CONFORMITY |
| BS 2011-3A & B:1977 | Environmental testing. Background information Tests A (cold) and tests B (dry heat) |
| IEC 60191-3:1999 | Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits |
| BS 2011-2.1T:1981 | Environmental testing. Tests Test T. Soldering |
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