BS 9940-03.0:1983
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment Sectional specification: fixed precision resistors
Hardcopy , PDF
English
10-31-1983
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National foreword
Committees responsible
Section One - General
1. General
1.1 Scope
1.2 Object
1.3 Related documents
1.4 Information to be given in a detail specification
Section Two - Preferred ratings, characteristics and
test severities
2. Preferred ratings, characteristics and test
severities
2.1 Preferred characteristics
2.2 Preferred values of ratings
2.3 Preferred test severities
Section Three - Quality assessment procedures
3. Quality assessment procedures
3.1 Structurally similar components
3.2 Qualification approval
3.3 Quality conformance inspection
Prescribes preferred ratings and characteristics and selects methods of test and inspection requirements for detail specifications for this type of resistor.
| Committee |
W/-
|
| DevelopmentNote |
Also numbered as IEC 60115-5 and QC 400300 Supersedes 79/21297 DC (10/2005)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
This standard applies to fixed precision resistors for use in electronic equipment.
| BS 9940-03.01:1984 | Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment Blank detail specification: fixed precision resistors. Assessment level E |
| BS QC 400302:1992 | Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed precision resistors. Assessment level F |
| BS 2488:1966 | Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equipment |
| BS 9940-0:1983 | Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment Generic specification |
| BS 6001(1972) : AMD 5054 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION |
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