BS 9000(1967) : LATEST
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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| DocumentType |
Standard
|
| PublisherName |
British Standards Institution
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| Status |
Superseded
|
| BS CECC40301 001-004(1977) : 1977 | DETAIL SPECIFICATION FOR FIXED WIREWOUND INSULATED PRECISION RESISTORS - FULL ASSESSMENT LEVEL |
| BS CECC 90104:1981 | Specification for harmonized system of quality assessment for electronic components. Family specification: C. Mos digital integrated circuits, series 4000B and 4000UB |
| BS QC 300203:1985 | Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte and foil electrode. Assessment level E |
| BS CECC 75101:1984 | Specification for harmonized system of quality assessment for electronic components. Example detail specification/blank detail specification. Two-part and edge socket connectors for printed board application |
| BS 9612 N018:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS CECC 46001:1977 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cold cathode indicator tubes |
| BS QC 410101:1990 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Load screw actuated and rotary preset potentiometers. Assessment level E |
| BS 9305 N001:1972 | Detail specification for silicon voltage regulator diodes. 1.5 W, 3.3 to 33 V (5%), hermetically sealed. General application category Q |
| BS 9940-03.01:1984 | Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment Blank detail specification: fixed precision resistors. Assessment level E |
| BS QC 750103:1990 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification |
| BS 9301 N002:1971 | Detail specification for general purpose silicon signal diodes. 150 mA, 150 V, hermetically sealed, glass encapsulation. General application category Q |
| BS 9070-4:1971 | Specification for fixed capacitors of assessed quality: generic data and methods of test Polystyrene dielectric capacitors |
| BS 9130:1972 | Specification for potentiometers of assessed quality: generic data and methods of test |
| BS 9751:1979 | Blank detail specification for fixed insulated (unshielded) r.f. inductors at the full assessment level |
| BS 9364 N016:1979 | Detail specification for low power silicon n-p-n switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level |
| BS CECC 30601:1980 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed ceramic dielectric capacitors, class 1 |
| DEFSTAN 66-31/2(1991) : 1991 | BASIC REQUIREMENTS AND TESTS FOR PROPRIETARY ELECTRONIC AND ELECTRICAL TEST EQUIPMENT |
| DEFSTAN 59-1(PT1)/1(1986) : 1986 AMD 1 1988 | CRYSTAL UNITS, QUARTZ - PART 1: GENERAL REQUIREMENTS |
| BS 9305 N041:1972 | Detail specification for silicon voltage regulator diodes. 400 mW, 2.7 to 33 V (5%), hermetically sealed, glass encapsulation. General application category Q |
| BS 9133 N001-003(1975) : 1975 | DETAIL SPECIFICATION FOR SINGLE TURN LOW POWER NON-WIRE WOUND ROTARY POTENTIOMETERS - SPINDLE INSULATED FROM RESISTANCE ELEMENT, SPINDLE AND PANEL SEALED OR CONTAINER, SPINDLE AND PANEL SEALED - FULL ASSESSMENT LEVEL |
| BS 9612 N017:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9751 N0001:1980 | Detail specification for fixed insulated (unshielded) radio frequency inductors. Wire wound on ferrite, iron dust or phenolic cylindrical former. Full assessment level |
| BS EN 135000:1993 | Harmonized system of quality assessment for electronic components. Generic specification: travelling wave amplifier tubes |
| BS 9070-1&2(1969) : 1969 AMD 7393 | SPECIFICATION FOR FIXED CAPACITORS OF ASSESSED QUALITY: GENERIC DATA AND METHODS OF TEST - PRINCIPLES AND MANDATORY PROCEDURES - GENERAL RULES FOR DRAFTING DETAIL SPECIFICATIONS |
| BS QC 300202:1985 | Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte and porous anode. Assessment level E |
| BS 9400:1970 | Specification for integrated electronic circuits and micro-assemblies of assessed quality (qualification approval procedures): generic data and methods of test |
| BS QC 750110:1990 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Reverse blocking triode thyristors, ambient and case-rated, up to 100 A |
| BS 9133:1973 | Rules for the preparation of detail specifications for single turn low power rotary potentiometers of assessed quality |
| BS 9925-01.01:1984 | Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications Blank detail specification: magnetic oxide cores for inductor applications. Assessment level A |
| BS 9220:1971 | Specification for rigid waveguide tubing of assessed quality: generic data and methods of test |
| BS 9150:1983 | Specification for electrical relays of assessed quality: generic data and methods of test |
| BS 9041:1978 | Rules for the preparation of detail specifications for gas filled microwave switching tubes of assessed quality: tunable and broadband TR tubes and TR limiters. Full assessment level |
| BS 9612 N021:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9734:1978 | Sectional specification for pulse transformers of assessed quality for use in electronic equipment: full assessment level |
| BS 9940-04.01:1984 | Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment Blank detail specification: fixed resistor networks with individually measurable resistors all of equal value and equal dissipation. Assessment level E |
| BS QC 301201:1984 | Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed metallized polypropylene film dielectric d.c. capacitors. Assessment level E |
| BS QC 960200:1992 | Harmonized system of quality assessment for electronic components. Electromechanical switches for use in electronic equipment. Sectional specification for lever (toggle) switches |
| BS QC 960400:1992 | Harmonized system of quality assessment for electronic components. Electromechanical switches for use in electronic equipment. Sectional specification for pushbutton switches |
| BS EN 125100:1993 | Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for inductor applications |
| BS EN 150010:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient rated thyristors |
| BS 9054:1971 | Rules for the preparation of detail specifications for radar display cathode ray tubes of assessed quality |
| BS 9121:1988 | Blank detail specification for radio interference suppression filters of assessed quality. Basic and full assessment levels |
| BS 9753:1986 | Sectional specification for variable r.f. type inductors of assessed quality for use in electronic equipment for capability approval |
| BS 9750:1990 | Specification for fixed radio frequency inductors of assessed quality: generic data and methods of test |
| BS 9525 N0001:1982 | Detail specification for multi-contact two-part printed board electrical connectors |
| BS 9733:1985 | Sectional specification for pulse transformers of assessed quality for use in electronic equipment for capability approval |
| BS 9522 N0001:1982 | Detail specification for multi-contact circular electrical connectors for d.c. and low frequency applications. Bayonet coupling with front release, rear removable crimp contacts. Full assessment level |
| BS CECC 90103:1983 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS |
| BS CECC 41000:1977 | Harmonized system of quality assessment for electronic components: generic specification for potentiometers |
| BS 9210:1984 | Specification for radio frequency connectors of assessed quality: generic data and methods of test |
| BS 9741:1986 | Sectional specification for inductors of assessed quality for use in electronic equipment for capability approval |
| BS 9727:1985 | Sectional specification for power transformers of assessed quality for use in electronic equipment for capability approval |
| BS 9612 N016:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9210-N001.1(1975) : 1975 | DETAIL SPECIFICATION FOR RADIO FREQUENCY CONNECTORS (TYPE BNC) - SEALED, SOLDERED, CAPTIVE CONTACT, 50 OHMS - FULL ASSESSMENT LEVEL |
| BS EN 136001:1996 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pulsed magnetrons (excluding frequency agile magnetrons) |
| BS 9070 N003:1971 | Detail specification for fixed metallized mica dielectric capacitors (style C2AEA). Rectangular non-metallic case, axial wires at both ends. General application category |
| BS 9612 N005:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9364 N013:1979 | Detail specification for low power silicon p-n-p switching transistors. 25 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level |
| BS 6943:1988 | Classification of shapes of electronic components for placement on printed wiring boards |
| BS 9925-02.01 & 02.02(1988) : 1988 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - INDUCTOR AND TRANSFORMER CORES FOR TELECOMMUNICATIONS - BLANK DETAIL SPECIFICATION: MAGNETIC OXIDE CORES FOR BROAD-BAND TRANSFORMERS - ASSESSMENT LEVELS A AND B |
| BS CECC 16100:1980 | Harmonized system of quality assessment for electronic components. Sectional specification: electromechanical all-or-nothing relays |
| BS 9073 N0034:1978 | Detail specification for fixed tantalum electrolytic capacitors. Porous anode, polar non-solid electrolyte. Tubular insulated metallic case, PTFE/elastomer seal, axial wire terminations. Full plus additional assessment level |
| BS 9612 N007:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9612 N008:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9090:1977 | Variable capacitors of assessed quality: generic data and methods of test |
| BS QC 750108:1990 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A |
| BS 9521:1983 | Specification for removable contacts of assessed quality for electrical connectors as defined by BS 9520: generic data, methods of test and rules for the preparation of detail specifications |
| BS 9131 N001-016(1974) : 1974 AMD 4679 | |
| BS 9031:1971 | Rules for the preparation of detail specifications for pulsed fixed-frequency magnetrons of assessed quality |
| BS EN 136000:1993 | Harmonized system of quality assessment for electronic components: generic specification: magnetrons |
| BS 9210-N007.1(1976) : 1976 | DETAIL SPECIFICATION FOR RADIO FREQUENCY CONNECTORS (TYPE SMB) - UNSEALED, SOLDERED, CAPTIVE CONTACT, 50 OHMS, SNAP-ON COUPLINGS - FULL ASSESSMENT LEVEL |
| BS 9612 N020:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9526 N0003:1979 | Detail specification for multi-contact edge socket electrical connectors. Single or double sided, open ended, guide key location, replaceable contacts, through-board solder or wire wrap terminations. Full assessment level |
| BS QC 300401:1984 | Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed metallized polyethylene terephthalate film dielectric d.c. capacitors. Assessment level E |
| BS 9925-02.0:1987 | Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications Sectional specification: magnetic oxide cores for broad-band transformers |
| BS 9563:1979 | Specification for rotary (manual) switches of assessed quality: generic data and methods of test; general rules for the preparation of detail specifications |
| BS 9520:1983 | Specification for electrical connectors of assessed quality for d.c. and low frequency application: generic data, methods of test and capability approval procedures |
| BS 9522 N0003:1990 | Detail specification for multi-contact circular electrical connectors for d.c. and low frequency applications. Bayonet couplingnon-barrier sealed, environment resistant with rear insertable, rear release, rear removable crimp contacts also barrier sealedwith non-removable solder contact styles. Full plus airframe fit assessment |
| BS 9074 N007:1981 | Detail specification for polystyrene film dielectric capacitors, extended foil. Rectangular non-metallic case, unidirectional terminations. Full plus additional assessment level |
| BS 9522:1990 | Rules for the preparation of detail specifications for circular electrical connectors of assessed quality for d.c. and low frequency applications. Full, basic and full plus airframe assessment levels |
| BS EN 135001:1997 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW power amplifier travelling wave tubes up to 500 watts |
| BS 9210 N0009-1:1978 | Detail specification for radio frequency connectors (series SMC) Unsealed, soldered, captive contact, 50 Ω, screw coupling - Full assessment level |
| BS EN 111001:1996 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cathode ray tubes |
| BS 9076 N001-004(1974) : 1974 AMD 3815 | DETAIL SPECIFICATION FOR FIXED METALLIZED POLYETHYLENE TEREPHTHALATE (PETP) FILM OR METALLIZED POLYCARBONATE FILM DIELECTRIC CAPACITORS - RECTANGULAR NON-METALLIC CASE AXIAL OR RADIAL TERMINATIONS, CENTRALLY SPACED - FULL ASSESSMENT LEVEL |
| BS 9075 N023:1978 | Detail specification for fixed monolithic ceramic dielectric capacitors (type 1B). Rectangular non-metallic case, centred wires on one face. Full assessment level |
| BS 9612 N006:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, 47 U/2, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9305 N042:1972 | Detail specification for silicon voltage regulator diodes. 1.5 W, 6.8 to 200 V (5%), hermetically sealed. General application category C |
| BS 9561:1979 | Specification for lever operated switches of assessed quality: generic data and methods of test; general rules for the preparation of detail specifications |
| BS 9100:1983 | Specification for capability approval for custom-built capacitors and capacitor modules: generic data and methods of test |
| DEFSTAN 66-16/1(1975) : 1975 | TEST SET, SAFETY, VOLTAGE DETECTION |
| BS 9364 N007 and N009:1978 | Detail specification for low power silicon n-p-n switching transistors. 20 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level |
| BS QC 300201:1985 | Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with solid electrolyte and porous anode. Assessment level E |
| BS 9070-7:1971 | Specification for fixed capacitors of assessed quality: generic data and methods of test Mica dielectric capacitors |
| BS 9032:1975 | Rules for the preparation of detail specifications for pulsed magnetrons (excluding frequency-agile magnetrons) of assessed quality. Basic assessment level |
| BS 9526 N0002:1979 | Detail specification for multi-contact edge socket electrical connectors. Single or double sided, open ended, metal fixing flanges, guide key location, replaceable contacts, through-board solder or wire wrap terminations. Full assessment level |
| BS 9721:1985 | Sectional specification for signal transformers of assessed quality for use in electronic equipment for capability approval |
| BS 9612 N019:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9450:1975 | Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures): generic data and methods of test |
| BS 9074 N002:1974 | Detail specification for fixed polystyrene foil dielectric capacitors. Tubular insulated case, axial terminations. Full asessment level |
| BS EN 143004:1992 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (rod type) |
| BS 9564:1980 | Specification for push-button switches of assessed quality: generic data and methods of test; general rules for the preparation of detail specifications |
| BS EN 143001:1992 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (beads in solid glass or vitreous enamel) |
| BS EN 116000-2:1994 | Harmonized system of quality assessment for electronic components. Generic specification: electromechanical all-or-nothing relays Generic data and methods of test for time delay relays |
| BS 9526 N0001:1978 | Detail specification for multi-contact edge socket electrical connectors. Single or double sided, closed ended, replaceable contacts, through-board solder or wire wrap terminations. Full assessment level |
| BS EN 143003:1992 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (disc type) |
| BS 9940-04.02:1984 | Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment Blank detail specification: fixed resistor networks with individually measurable resistors of either different resistance values or different rated dissipations. Assessment level E |
| BS QC 400201:1993 | Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed power resistors. Assessment level E |
| BS 9612 N009:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS QC 750102:1990 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification |
| BS 9305 N044:1974 | Detail specification for silicon voltage regulator diodes. 1.0 W, 3.3 to 33 V (5%), hermetically sealed. Full assessment level |
| BS 9612 N010:1979 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 6.0 to 25 MHz frequency range. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9075 N024:1978 | Detail specification for fixed monolithic ceramic dielectric capacitors (type 2C1). Rectangular non-metallic case, centred wires on one face. Full assessment level |
| BS 9364 N011:1978 | Detail specification for low power silicon p-n-p switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level |
| BS 9070 N002:1971 | Detail specification for fixed metallized mica dielectric capacitors (style C2AED). Rectangular non-metallic case, centred wires on one face. General application category |
| BS 9070-5:1971 | Specification for fixed capacitors of assessed quality: generic data and methods of test Ceramic dielectric capacitors |
| BS 9074 N007:1978 | Detail specification for fixed polystyrene film dielectric extended foil capacitors. Rectangular non-metallic case, unidirectional terminations. Full plus additional assessment level |
| BS 9612 N004:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, 47 U/2, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS QC 750104:1991 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications |
| BS 9925-03.01:1988 | Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications Blank detail specification: magnetic oxide cores for transformers and chokes for power applications. Assessment level A |
| BS EN 136002:1996 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW magnetrons for RF heating or cooking applications |
| BS 7262:1990 | Specification for automatic safe load indicators |
| BS EN 143002:1992 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (beads in envelopes) |
| BS 9070-6:1971 | Specification for fixed capacitors of assessed quality: generic data and methods of test Polycarbonate dielectric capacitors and polyethylene terephthalate dielectric capacitors for d.c. use and polypropylene dielectric capacitors for d.c. and a.c. use |
| BS CECC 46000:1978 | Harmonized system of quality assessment for electronic components: generic specification: cold cathode indicator tubes |
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