BS 6493-3:1985
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
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Semiconductor devices Mechanical and climatic test methods
Hardcopy , PDF
10-26-2018
English
01-31-1986
National foreword
Committees responsible
Chapter I: General
1. Scope and purpose
2. Object
3. Terms, definitions and letter symbols
4. Standard atmospheric conditions
5. External visual examination and verification of
dimensions
6. Electrical measurements
Chapter II: Mechanical test methods
1. Robustness of terminations
1.1 Tensile
1.2 Bending
1.3 Torsion
1.4 Torque
2. Soldering
2.1 Solderability
2.2 Resistance to soldering heat
2.3 Resistance of plastic encapsulated SMDs to the
combined effect of moisture and soldering heat
3. Vibration (sinusoidal)
4. Shock
5. Acceleration, steady state
6. Bond strength test
6.1 General
6.2 Methods A and B
6.3 Method C
6.4 Method D
6.5 Methods E and F
6.6 Information to be given in the relevant
specification
7. Die shear strength test
Appendix to Sub-clause 6.2 - Guidance
Chapter III: Climatic test methods
1. Change of temperature
1.1 Rapid change of temperature: two-chamber method
1.2 Rapid change of temperature: two-fluid-bath method
2. Storage (at high temperature)
3. Low air pressure
4. Damp heat, cyclic
5A. Damp heat, steady state
5B. Damp heat, steady state, accelerated
5C. Damp heat, steady state, highly accelerated
6. Composite temperature/humidity cyclic test
7. Sealing
7.1 Bomb pressure test
7.2 Text deleted
7.3 Fine leak detection: radioactive krypton method
7.4 Fine leak detection: tracer gas method with mass
spectrometer
7.5 Gross leak, perfluorocarbon vapour method using
electronic detection apparatus
8. Salt mist
9. Thermal intermittence test
10. Internal moisture content measurement by mass
spectrometry method
Chapter IV: Miscellaneous test methods
1. Flammability tests of plastic-encapsulated devices
1.1 Flammability (internally induced)
1.2 Flammability (externally induced)
2. Permanence of marking
Special requirements for test methods additional to IEC 60068, and certain specific and complete test methods.
Committee |
EPL/47
|
DocumentType |
Standard
|
Pages |
42
|
PublisherName |
British Standards Institution
|
Status |
Withdrawn
|
SupersededBy |
BS QC 750005:1987 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diodes |
BS QC 750001:1986 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Signal diodes, switching diodes and controlled avalanche diodes |
BS QC 790132:1992 | Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays) |
BS QC 750103:1990 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification |
BS QC 790130:1992 | Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU) |
BS CECC 90000:1991 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
BS IEC 60747-10:1991 | Semiconductor devices Generic specification for discrete devices and integrated circuits |
BS QC 750110:1990 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Reverse blocking triode thyristors, ambient and case-rated, up to 100 A |
BS QC 790303:1994 | Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC) |
BS QC 790110:1992 | Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits |
BS QC 790111:1993 | Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories |
BS QC 750107:1991 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications |
BS 9450:1998 | Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures). Generic data and methods of test |
BS QC 750108:1990 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A |
BS EN 116000-3:1996 | Harmonized system of quality assessment for electronic components. Generic specification: electromechanical all-or-nothing relays Test and measurement procedures |
BS 9400:1970 | Specification for integrated electronic circuits and micro-assemblies of assessed quality (qualification approval procedures): generic data and methods of test |
BS QC 160000-1:1987 | Harmonized system of quality assessment for electronic components. Electrical relays. Generic specification: electromechanical all-or-nothing relays Test and measurement procedures |
BS QC 750112:1988 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz |
CECC 16000 PT1 : 90 AMD 2 92 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: ELECTROMECHANICAL ALL-OR-NOTHING RELAYS - PART 1: GENERAL |
BS QC700000(1991) : 1991 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS |
BS QC 790304:1994 | Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC) |
BS QC 760000:1990 | Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification |
BS QC 790104:1992 | Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Family specification. Complementary MOS digital integrated circuits, series 4000 B and 4000 UB |
BS 9450:1975 | Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures): generic data and methods of test |
BS QC 750109:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A |
BS CECC 16000-1:1992 | Harmonized system of quality assessment for electronic components. Generic specification: electromechanical all-or-nothing relays General |
BS QC 750106:1993 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications |
BS QC 750102:1990 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification |
BS EN 190000:1996 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
BS QC 750113:1994 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: reverse blocking triode thyristors, ambient and case-rated, for currents greater than 100 A |
BS QC 750104:1991 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications |
BS QC 790105:1993 | Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories |
EN 190000:1995 | Generic Specification: Monolithic integrated circuits |
BS 6458-2.2(1984) : 1984 | FIRE HAZARD TESTING FOR ELECTROTECHNICAL PRODUCTS - METHODS OF TEST - NEEDLE FLAME TEST |
BS 6493-1.1:1984 | Semiconductor devices. Discrete devices General |
BS 6493-2.1:1985 | Semiconductor devices. Integrated circuits General |
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