BS 6493-2.1:1985
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Semiconductor devices. Integrated circuits General
Hardcopy , PDF
07-30-2002
English
08-06-2002
National foreword
Committees responsible
Chapter I: Scope and presentation of IEC Publication 748
1 Scope
2 Presentation
Chapter II: Purpose & presentation of Publication 748-1
1 General
2 Purpose
3 Presentation
Chapter III: Purpose, presentation and requirements on
the contents of publications 748-2, 748-3, etc. (under
consideration)
Chapter IV: Terminology, general
1 General terms
2 Types of devices
3 Clamping characteristics of integrated circuits
4 Technological concepts
5 Concepts for particular device types of film
integrated circuits and hybrid film integrated
circuits
Chapter V: Letter symbols, general
1 Basic letters
2 Subscripts for digital integrated circuits
2.1 Voltages and currents
2.2 Switching times
3 Subscripts for analogue integrated circuits
Chapter VI: Essential ratings and characteristics,
general
1 Introduction
2 Standard format for the presentation of published
data and method for describing essential ratings
and characteristics and function specification of
integrated circuits
2.1 Standard format for the presentation of published
data
2.2 Method for describing essential ratings and
characteristics and function specification of
integrated circuits
3 Basic "rating" definitions
4 Definitions of cooling conditions
5 List of preferred temperatures
6 List of preferred voltages
6.1 List of preferred nominal voltages for recommended
operating conditions
6.2 Tolerances on voltages
7 Mechanical ratings, characteristics and other data
8 Production spread and compliance
9 Printed wiring and printed circuits
Chapter VII: Measuring methods, general
1 Basic requirements
1.1 Introduction
1.2 General precautions
2 Specific requirements on the measuring methods
3 Numbering system for measuring methods
3.1 Numbering principle
3.2 Numbering list of measuring methods for integrated
circuits
3.3 Application matrices
3.4 Updating
Chapter VIII: Acceptance and reliability of integrated
circuits
Section One - General
Section Two - General principles
(under consideration)
Section Three - Electrical endurance tests
1 Purpose and presentation
2 General requirements
2.1 Conditions for electrical tests
2.2 Duration of test
2.3 Failure-defining characteristics and measurements
2.4 Failure criteria
2.5 Precautions
3 Specific requirements. General
3.1 List of endurance tests
3.2 Conditions for endurance tests
3.3 Failure-defining characteristics and failure
criteria for acceptance after endurance tests
3.4 Failure-defining characteristics and failure
criteria for reliability (under consideration)
3.5 Procedure in case of a testing error
Chapter IX: Electrostatic sensitive devices
(see Publication 747-1, Chapter IX)
General recommendations for integrated circuits.
Committee |
EPL/47
|
DevelopmentNote |
Also numbered as IEC 60748-1 Supersedes BS 3363(1980), BS 3363:SUPP1(1981), BS 3363:SUPP2(1981), 87/23034 DC and 87/32332 DC (08/2002)
|
DocumentType |
Standard
|
Pages |
38
|
PublisherName |
British Standards Institution
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
Standards | Relationship |
IEC 60748-1:1984 | Identical |
BS 6493-2.2(1986) : 1986 | SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS FOR DIGITAL INTEGRATED CIRCUITS |
BS CECC 90000:1991 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
BS IEC 60747-10:1991 | Semiconductor devices Generic specification for discrete devices and integrated circuits |
BS QC 790303:1994 | Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC) |
BS EN 117000:1997 | Harmonized system of quality assessment for electronic components. Generic specification. Solid state all-or-nothing relays. Generic data and methods of test |
BS 6493-1.1:1984 | Semiconductor devices. Discrete devices General |
BS 6493-3:1985 | Semiconductor devices Mechanical and climatic test methods |
BS CECC 90200:1988 | Harmonized system of quality assessment for electronic components: sectional specification: analogue monolithic integrated circuits |
BS CECC 90300:1988 | Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits |
BS QC 790202:1991 | Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers |
BS 6493-2.3:1987 | Semiconductor devices. Integrated circuits Recommendations for analogue integrated circuits |
BS QC700000(1991) : 1991 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS |
BS QC 790304:1994 | Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC) |
BS QC 760000:1990 | Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification |
BS 6493-2.4(1989) : 1989 | SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS INTERFACE INTEGRATED CIRCUITS |
BS CECC 90115:1994 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits |
BS EN 190000:1996 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
EN 190000:1995 | Generic Specification: Monolithic integrated circuits |
BS 6493-1.1:1984 | Semiconductor devices. Discrete devices General |
BS 3939-12:1985 | Guide for graphical symbols for electrical power, telecommunications and electronics diagrams Binary logic elements |
BS 6493-2.4(1989) : 1989 | SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS INTERFACE INTEGRATED CIRCUITS |
BS 6493-2.2(1986) : 1986 | SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS FOR DIGITAL INTEGRATED CIRCUITS |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
BS 4200-3:1979 | Guide on the reliability of electronic equipment and parts used therein Presentation of reliability data on electronic components (or parts) |
BS 6493-2.3:1987 | Semiconductor devices. Integrated circuits Recommendations for analogue integrated circuits |
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