BIS IS/IEC 61558-2-6 : 1ED 2016
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES
01-08-2024
08-09-2016
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure neutron irradiated soft error test
6 Evaluation
7 Summary
Annex A (informative) - Additional information for the
applicable procurement specification
Annex B (informative) - White neutron test apparatus
Annex C (informative) - Failure rate calculation
Bibliography
Defines a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays.
| Committee |
TC 47
|
| DevelopmentNote |
Stability Date: 2020. (07/2016)
|
| DocumentType |
Standard
|
| PublisherName |
Bureau of Indian Standards
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| PN EN 60749-44 : 2017 | Identical |
| DIN EN 60749-44:2017-04 | Identical |
| CEI EN 60749-44 : 1ED 2017 | Identical |
| BS EN 60749-44:2016 | Identical |
| NF EN 60749-44 : 2016 | Identical |
| EN 60749-44:2016 | Identical |
| NEN EN IEC 60749-44 : 2016 | Identical |
| SN EN 60749-44:2016 | Identical |
| IEC 60749-38:2008 | Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory |
| IEC 62396-4:2013 | Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects |
| IEC 62396-5:2014 | Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems |
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