ANSI/ESDA/JEDEC JS-002:2022
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
ESDA/JEDEC Joint Standard For Electrostatic Discharge Sensitivity Testing Charged Device Model (CDM) Device Level
Hardcopy , PDF
English
07-26-2022
08-07-2025
This document establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).
| Committee |
JC-14.1
|
| DocumentType |
Standard
|
| ISBN |
1-58537-333-8
|
| Pages |
52
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| DSCC V62/25635A:2025 | MICROCIRCUIT, LINEAR BiCMOS (LBCSOI2), RADIATION TOLERANT, 2.7 V TO 80 V, 1.1 MHz, RADIATION TOLERANT, 2.7 V TO 80 V, 1.1 MHz, ULTRA-PRECISE, CURRENT-SENSE AMPLIFIER, MONOLITHIC SILICON |
| DSCC V62/24640:2025 | MICROCIRCUIT, BiCMOS, HIGH-PRECISION QUAD COMPARATORS WITH OPEN-DRAIN OR PUSH-PULL OUTPUT, MONOLITHIC SILICON |
| DSCC V62/25615:2025 | MICROCIRCUIT, DIGITAL, ENHANCED PRODUCT, OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS, MONOLITHIC SILICON |
| DSCC V62/24626:2025 | MICROCIRCUIT, BiCMOS, RADIATION-TOLERANT 3V TO 5.5 V RS-485 TRANSCEIVER WITH FLEXIBLE I/O SUPPLY AND IEC ESD PROTECTION , MONOLITHIC SILICON |
| JEDEC JESD 88F:2018 | JEDEC Dictionary of Terms for Solid- State Technology – 7th Edition |
| IEC 61340-5-1:2024 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements |
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