14/30282293 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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BS EN 60679-1 - PIEZOELECTRIC AND ASSOCIATED MATERIAL OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
Hardcopy , PDF
12-31-2017
English
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FOREWORD
INTRODUCTION
1 Scope
2 Normative reference
3 Terms, definitions and general information
4 Quality assessment procedures
Annex A (normative) - Load circuit for logic
drive
Annex B (normative) - Latch-up test
Annex C (normative) - Electrostatic discharge
sensitivity classification
Annex D (normative) - Digital Interface crystal
oscillator's function
Bibliography
BS EN 60679-1
| Committee |
EPL/49
|
| DocumentType |
Draft
|
| Pages |
31
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| IEC 61837-1:2012 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines |
| IEC 60679-4:1997 | Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval |
| IEC 61837-2:2011+AMD1:2014 CSV | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part2: Ceramic enclosures |
| IEC 60679-5:1998 | Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval |
| IEC 61837-4:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines |
| IEC 60749-27:2006+AMD1:2012 CSV | Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) |
| IEC 61019-1:2004 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| IEC 60469-1:1987 | Pulse techniques and apparatus. Part 1: Pulse terms and definitions |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| IEC GUIDE 102:1996 | Electronic components - Specification structures for quality assessment (Qualification approval and capability approval) |
| IEC 61019-2:2005 | Surface acoustic wave (SAW) resonators - Part 2: Guide to the use |
| IEC 60749-26:2013 | Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
| IEC 60050-561:2014 | International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
| IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
| IEC 60748-2:1997 | Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits |
| IEC 60679-3:2012 | Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections |
| IEC 60679-2:1981 | Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators |
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