09/30207307 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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BS EN 60115-2 - FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - PART 2: SECTIONAL SPECIFICATION: FIXED LOW-POWER NON-WIREWOUND RESISTORS
Hardcopy , PDF
02-28-2015
English
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1 General
1.1 Scope
1.2 Object
1.3 Normative references
1.4 Information to be specified in a detail specification
1.5 Product classification
2 Preferred characteristics, ratings and test severities
2.1 Preferred characteristics
2.2 Preferred values of ratings
2.3 Preferred test severities
2.4 Preparation of specimen
3 Quality assessment procedures
3.1 General
3.2 Definitions
3.3 Formation of inspection lots
3.4 Qualification approval
3.5 Quality Conformance Inspection
3.6 Technology approval procedures
3.7 Delayed delivery
Annex A (normative) 0 ohms Resistors (Jumper)
A.1 Information to be specified in a detail specification
A.2 Preferred characteristics
A.3 Preferred ratings
A.4 Preferred severities
A.5 Test schedule for Qualification Approval
A.6 Test schedule for Quality Conformance Inspection
Annex B (informative) Letter symbols and abbreviations
B.1 Letter symbols
B.2 Abbreviations
Bibliography
BS EN 60115-2
| Committee |
EPL/40X
|
| DocumentType |
Draft
|
| Pages |
40
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| IEC 61193-2:2007 | Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 60068-2-58:2015+AMD1:2017 CSV | Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) |
| IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
| IECQ 001002-3:2005 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES |
| IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
| IEC 60068-2-13:1983 | Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
| IEC 61760-1:2006 | Surface mounting technology - Part 1: Standard method for the specification of surface mounting components (SMDs) |
| IEC 60027-1:1992 | Letters symbols to be used in electrical technology - Part 1: General |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| IEC 60294:2012 | Measurement of the dimensions of a cylindrical component with axial terminations |
| IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
| IEC TR 60440:1973 | Method of measurement of non-linearity in resistors |
| IEC 60062:2016 | Marking codes for resistors and capacitors |
| IEC 61340-3-1:2006 | Electrostatics - Part 3-1: Methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms |
| IEC 60301:2012 | Preferred diameters of wire terminations of capacitors and resistors |
| IEC 60063:2015 | Preferred number series for resistors and capacitors |
| IEC 60286-3:2013 | Packaging of components for automatic handling - Part 3: Packaging of surface mount components on continuous tapes |
| IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| IEC 60060-1:2010 | High-voltage test techniques - Part 1: General definitions and test requirements |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| IEC 60115-1:2008 | Fixed resistors for use in electronic equipment - Part 1: Generic specification |
| IEC 60195:2016 | Method of measurement of current noise generated in fixed resistors |
| IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
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