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08/30180398 DC : 0

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

BS EN 60747-16-5 - SEMICONDUCTOR DEVICES - PART 16-5: MICROWAVE INTEGRATED CIRCUITS - OSCILLATORS

Available format(s)

Hardcopy , PDF

Superseded date

09-30-2013

Superseded by

BS EN 60747-16-5:2013

Language(s)

English

US$26.05
Excluding Tax where applicable

1 Scope
2 Normative references
3 Terms and definitions
4 Essential ratings and characteristics
  4.1 General
  4.2 Application description
  4.3 Specification of the function
  4.4 Limiting values (absolute maximum rating system)
  4.5 Operating conditions (within the specified operating
       temperature range)
  4.6 Electrical characteristics
  4.7 Mechanical and environmental ratings, characteristics
       and data
  4.8 Additional information
5 Measuring methods
  5.1 General
  5.2 Oscillation frequency (f[osc])
  5.3 Output power (P[o,osc])
  5.4 Phase Noise (N[phase])
  5.5 Tuning sensitivity (S[f,v])
  5.6 Frequency pushing (f[osc,push])
  5.7 Frequency pulling (f[osc,pull])
  5.8 nth order harmonic distortion ratio (P[1]/P[nth])
  5.9 Output power flatness (DeltaP[o,osc])
  5.10 Tuning linearity
  5.11 Frequency temperature coefficient (alpha[f,temp])
  5.12 Output power temperature coefficient (alpha[P,temp])
  5.13 Spurious distortion ratio (P[1]/P[s])
  5.14 3dB modulation frequency band (B[mod,3dB])
  5.15 Sensitivity flatness
6 Verifying methods
  6.1 Load mismatch tolerance (Psi[L])
  6.2 Load mismatch ruggedness (Psi[R])

BS EN 60747-16-5

Committee
EPL/47
DocumentType
Draft
Pages
36
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

IEC 60747-4:2007+AMD1:2017 CSV Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
IEC 61340-5-1:2016 Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
IEC TR 61340-5-2:2007 Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
IEC 60748-3:1986 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits

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