IEC TS 62239:2008
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Process management for avionics - Preparation of an electronic components management plan
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
12-07-2012
English
21-10-2008
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviations
3.1 Terms and definitions
3.2 Abbreviations
4 Technical requirements
4.1 Component selection
4.2 Component application
4.2.1 Electromagnetic compatibility (EMC)
4.2.2 De-rating and stress analysis
4.2.3 Thermal analysis
4.2.4 Mechanical analysis
4.2.5 Testing, testability, and maintainability
4.2.6 Avionics radiation environment
4.3 Component qualification
4.3.1 General component qualification requirements
4.3.2 Component manufacturer quality management
4.3.3 Component manufacturer process management
approval
4.3.4 Demonstration of component qualification
4.3.5 Qualification of components from a supplier that is
not qualified
4.3.6 Distributor quality and process management approval
4.4 Continuous component quality assurance
4.4.1 General quality assurance requirements
4.4.2 On-going component quality assurance
4.4.3 Plan owner in-house continuous monitoring
4.4.4 Component design and manufacturing process change
monitoring
4.5 Component dependability
4.5.1 Reliability assessment
4.5.2 Component availability and associated risk
assessment
4.5.3 Component obsolescence
4.6 Component compatibility with the equipment
manufacturing process
4.7 Component data
4.8 Configuration control
4.8.1 Alternative sources
4.8.2 Equipment change documentation
4.8.3 Customer notifications and approvals
4.8.4 Focal organisation
5 Plan administration requirements
5.1 Using components outside the manufacturer's specified
temperature range
5.2 Plan organization
5.3 Plan terms and definitions
5.4 Plan focal point
5.5 Plan references
5.6 Plan applicability
5.7 Plan implementation
5.8 Plan acceptance
Bibliography
IEC/TS 62239:2008(E) defines the requirements for developing an Electronic Components Management Plan (ECMP) to assure customers and regulatory agencies that all of the electronic components in the equipment of the plan owner are selected and applied in controlled processes compatible with the end application and that the technical requirements detailed in Clause 4 are accomplished. In general, the owners of a complete electronic components management plan are avionics equipment manufacturers. This new edition refers to publications that were recently issued.
Committee |
TC 107
|
DevelopmentNote |
Supersedes IEC PAS 62239. (05/2003) Supersedes DEFSTAN 59-36/5(1995). (02/2004)
|
DocumentType |
Technical Specification
|
Pages |
25
|
PublisherName |
International Electrotechnical Committee
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
Standards | Relationship |
SAC GB/Z 31478 : 2015 | Identical |
DD IEC/TS 62239:2003 | Identical |
NEN NPR IEC/TS 62239 : 2008 | Identical |
PKN IEC/TS 62239 : 2006 | Identical |
06/30123954 DC : DRAFT MAR 2006 | |
UNE-EN 62402:2011 | Obsolescence management - Application guide |
EN 62321-1:2013 | Determination of certain substances in electrotechnical products - Part 1: Introduction and overview |
EN 62402 : 2007 | OBSOLESCENCE MANAGEMENT - APPLICATION GUIDE |
DEFSTAN 00-970(PT0)/9(2012) : 2012 | DESIGN AND AIRWORTHINESS REQUIREMENTS FOR SERVICE AIRCRAFT - PART 0: PROCEDURES FOR USE, CONTENT AND DEFINITIONS |
DEFSTAN 66-31(PT1)/2(2008) : 2008 | BASIC REQUIREMENTS AND TESTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 1: INTRODUCTION AND GUIDE TO THE SPECIFICATION AND SELECTION OF TEST AND MEASUREMENT EQUIPMENT BY THE PROCURING AUTHORITY |
DEFSTAN 00-970(PT9)/5(2009) : 2009 | DESIGN AND AIRWORTHINESS REQUIREMENTS FOR SERVICE AIRCRAFT - PART 9: UAV SYSTEMS |
DEFSTAN 00-970(PT0)/7(2011) : 2011 | DESIGN AND AIRWORTHINESS REQUIREMENTS FOR SERVICE AIRCRAFT - PART 0: PROCEDURES FOR USE, CONTENT AND DEFINITIONS |
DEFSTAN 66-31(PT2)/1(2007) : 2007 | BASIC REQUIREMENTS & TESTS FOR ELECTRONIC & ELECTRICAL TEST & MEASUREMENT EQUIPMENT - PART 2: CONTRACTOR GENERAL REQUIREMENTS |
DEFSTAN 00-970(PT0)/11(2013) : 2013 | DESIGN AND AIRWORTHINESS REQUIREMENTS FOR SERVICE AIRCRAFT - PART 0: PROCEDURES FOR USE, CONTENT AND DEFINITIONS |
DEFSTAN 02-305/3(2010) : 2010 | REQUIREMENTS FOR GEARING - MAIN PROPULSION |
DEFSTAN 02-339/3(2006) : 2006 | REQUIREMENTS FOR STEERING AND STABILIZER SYSTEMS FOR HM SURFACE SHIPS AND ROYAL FLEET AUXILIARIES |
DEFSTAN 00-970(PT0)/8(2011) : 2011 | DESIGN AND AIRWORTHINESS REQUIREMENTS FOR SERVICE AIRCRAFT - PART 0: PROCEDURES FOR USE, CONTENT AND DEFINITIONS |
DEFSTAN 00-970(PT0)/10(2013) : 2013 | DESIGN AND AIRWORTHINESS REQUIREMENTS FOR SERVICE AIRCRAFT - PART 0: PROCEDURES FOR USE, CONTENT AND DEFINITIONS |
DEFSTAN 66-31(PT1)/1(2007) : 2007 | BASIC REQUIREMENTS & TESTS FOR ELECTRONIC & ELECTRICAL TEST & MEASUREMENT EQUIPMENT - PART 1: INTRODUCTION AND GUIDE TO THE SPECIFICATION AND SELECTION OF TEST AND MEASUREMENT EQUIPMENT BY THE PROCURING AUTHORITY |
DEFSTAN 66-31(PT2)/2(2008) : 2008 | BASIC REQUIREMENTS & TESTS FOR ELECTRONIC & ELECTRICAL TEST & MEASUREMENT EQUIPMENT - PART 2: CONTRACTOR GENERAL REQUIREMENTS |
DD IEC PAS 62396-3 : DRAFT DEC 2007 | PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 3: OPTIMISING SYSTEM DESIGN TO ACCOMMODATE THE SINGLE EVENT EFFECTS (SEE) OF ATMOSPHERIC RADIATION |
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CEI EN 62402 : 2008 | OBSOLESCENCE MANAGEMENT - APPLICATION GUIDE |
I.S. EN 62321-1:2013 | DETERMINATION OF CERTAIN SUBSTANCES IN ELECTROTECHNICAL PRODUCTS - PART 1: INTRODUCTION AND OVERVIEW (IEC 62321-1:2013 (EQV)) |
GEIA STD 0016 : 2012 | PREPARING A DMSMS MANAGEMENT PLAN |
BS EN 62321-1:2013 | Determination of certain substances in electrotechnical products Introduction and overview |
CEI 111-55 : 2009 | ELECTROTECHNICAL PRODUCTS - DETERMINATION OF RESTRICTED SUBSTANCES - SAMPLING PROCEDURE - GUIDELINES |
DD IEC/PAS 62596:2009 | Electrotechnical products. Determination of restricted substances. Sampling procedure. Guidelines |
BS EN 62321-2:2014 | Determination of certain substances in electrotechnical products Disassembly, disjointment and mechanical sample preparation |
DD IEC TS 62396-3 : DRAFT OCT 2008 | PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 3: OPTIMISING SYSTEM DESIGN TO ACCOMMODATE THE SINGLE EVENT EFFECTS (SEE) OF ATMOSPHERIC RADIATION |
08/30192173 DC : 0 | BS EN 62542 ED1 - ENVIRONMENTAL STANDARDIZATION FOR ELECTRICAL AND ELECTRONIC PRODUCTS AND SYSTEMS - STANDARDIZATION OF ENVIRONMENTAL ASPECTS - GLOSSARY OF TERMS |
IEC TS 62396-3:2008 | Process management for avionics - Atmospheric radiation effects - Part 3: Optimising system design to accommodate the single event effects (SEE) of atmospheric radiation |
IEC TS 62396-1:2006 | Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment |
IECQ 001002-4:2008 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 4: AVIONICS ASSESSMENT PROGRAM REQUIREMENTS |
IEC TR 62240:2005 | Process management for avionics - Use of semiconductor devices outside manufacturers' specified temperature range |
IEC PAS 62686-1:2011 | Process management for avionics - Aerospace qualified electronic components (AQEC) - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors |
12/30268625 DC : 0 | BS IEC/PAS 62814/ED1 - DEPENDABILITY OF SOFTWARE PRODUCTS CONTAINING REUSABLE COMPONENTS - GUIDANCE FOR FUNCTIONALITY AND TESTS |
10/30229130 DC : 0 | BS EN 62321-1 ED 1 - DETERMINATION OF CERTAIN SUBSTANCES IN ELECTRO TECHNICAL PRODUCTS - PART 1: INTRODUCTION AND OVERVIEW |
CEI EN 62321-1 : 2014 | DETERMINATION OF CERTAIN SUBSTANCES IN ELECTROTECHNICAL PRODUCTS - PART 1: INTRODUCTION AND OVERVIEW |
11/30246255 DC : 0 | BS EN 62396-1 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT |
ARINC 804 : 2007 | FIBER OPTIC ACTIVE DEVICE SPECIFICATION |
I.S. EN 62402:2007 | OBSOLESCENCE MANAGEMENT - APPLICATION GUIDE |
API STD 17F : 2017 | SUBSEA PRODUCTION CONTROL SYSTEMS |
SAE AS 6462 : 2014 | AS5553A, FRAUDULENT/COUNTERFEIT ELECTRONIC PARTS; AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION VERIFICATION CRITERIA |
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IEC 62402:2007 | Obsolescence management - Application guide |
IEC 62321:2008 | Electrotechnical products - Determination of levels of six regulated substances (lead, mercury, cadmium, hexavalent chromium, polybrominated biphenyls, polybrominated diphenyl ethers) |
IEC PAS 62396-3:2007 | Process management for avionics - Atmospheric radiation effects - Part 3: Optimising system design to accommodate the Single Event Effects (SEE) of atmospheric radiation |
BS EN 62321:2009 | Electrotechnical products. Determination of levels of six regulated substances (lead, mercury, cadmium, hexavalent chromium, polybrominated biphenyls, polybrominated diphenyl ethers) |
DD IEC TS 62564-1 : DRAFT SEP 2011 | PROCESS MANAGEMENT FOR AVIONICS - AEROSPACE QUALIFIED ELECTRONIC COMPONENTS (AQEC) - PART 1: INTEGRATED CIRCUITS AND DISCRETE SEMICONDUCTORS |
I.S. EN 62321:2009 | ELECTROTECHNICAL PRODUCTS - DETERMINATION OF LEVELS OF SIX REGULATED SUBSTANCES (LEAD, MERCURY, CADMIUM, HEXAVALENT CHROMIUM, POLYBROMINATED BIPHENYLS, POLYBROMINATED DIPHENYL ETHERS) |
I.S. EN 62321-2:2014 | DETERMINATION OF CERTAIN SUBSTANCES IN ELECTROTECHNICAL PRODUCTS - PART 2: DISASSEMBLY, DISJOINTMENT AND MECHANICAL SAMPLE PREPARATION |
BS EN 62402:2007 | Obsolescence management. Application guide |
EN 62321-2:2014 | Determination of certain substances in electrotechnical products - Part 2: Disassembly, disjointment and mechanical sample preparation |
NF EN 62402 : 2008 | OBSOLESCENCE MANAGEMENT - APPLICATION GUIDE |
EN 62321:2009 | Electrotechnical products - Determination of levels of six regulated substances (lead, mercury, cadmium, hexavalent chromium, polybrominated biphenyls, polybrominated diphenyl ethers) |
MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
IECQ 001003:1998 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - GUIDANCE DOCUMENTS |
IEC 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
IEC 61340-5-1:2016 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements |
MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
ISO/TS 16949:2009 | Quality management systems Particular requirements for the application of ISO 9001:2008 for automotive production and relevant service part organizations |
IECQ 001002-4:2008 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 4: AVIONICS ASSESSMENT PROGRAM REQUIREMENTS |
IEC TR 61340-5-2:2007 | Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide |
IECQ 01:2014 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ SYSTEM) - BASIC RULES |
IECQ 001004:2006 | |
ISO 9004:2009 | Managing for the sustained success of an organization A quality management approach |
MIL-HDBK-263 Revision B:1994 | ELECTROSTATIC DISCHARGE CONTROL HANDBOOK FOR PROTECTION OF ELECTRICAL & ELECTRONIC PARTS, ASSEMBLIES & EQUIPMENT |
IEC 62402:2007 | Obsolescence management - Application guide |
ISO 9001:2015 | Quality management systems — Requirements |
IEC 61967-6:2002+AMD1:2008 CSV | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method |
ISO 9000:2015 | Quality management systems — Fundamentals and vocabulary |
MIL-HDBK-512 Revision A:2001 | PARTS MANAGEMENT |
MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
AIAA R 100 : A 2001 | RECOMMENDED PRACTICE FOR PARTS MANAGEMENT |
GEIA STD 0002-1 : 2005 | AEROSPACE QUALIFIED ELECTRONIC COMPONENT (AQEC) REQUIREMENTS, VOLUME 1 - INTEGRATED CIRCUITS AND SEMICONDUCTORS |
IEC TR 62240:2005 | Process management for avionics - Use of semiconductor devices outside manufacturers' specified temperature range |
EN 190000:1995 | Generic Specification: Monolithic integrated circuits |
SAE AS 9000 : 1998 | AEROSPACE BASIC QUALITY SYSTEM STANDARD |
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