IEC PAS 62686-1:2011
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Process management for avionics - Aerospace qualified electronic components (AQEC) - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
18-09-2012
English
21-04-2011
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FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and abbreviations
4 Abbreviations
5 Technical requirements
Annex A (normative) - STACK Specification
S/0001 Issue 14
IEC/PAS 62686-1:2011(E) defines the minimum requirements for general purpose 'off the shelf' COTS integrated circuits and discrete semiconductors for high reliability applications. This PAS complements IEC/TS 62564-1. IEC/TS 62564-1 is to be used for high reliability applications where additional manufacturer's data is required beyond the publicly available manufacturer published datasheets. This PAS is to be used wherever possible for components that typically can be applied to operate in high reliability applications within the manufacturers publicly available datasheet limits. It is recommended that this PAS be used in conjunction with IEC/TS 62239 for avionics applications.
| DocumentType |
Miscellaneous Product
|
| Pages |
44
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NEN NPR IEC/PAS 62686-1 : 2011 | Identical |
| DD IEC PAS 62686-1 : DRAFT JULY 2011 | Identical |
| DD IEC TS 62564-1 : DRAFT SEP 2011 | PROCESS MANAGEMENT FOR AVIONICS - AEROSPACE QUALIFIED ELECTRONIC COMPONENTS (AQEC) - PART 1: INTEGRATED CIRCUITS AND DISCRETE SEMICONDUCTORS |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| IEC 61340-5-1:2016 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements |
| IEC TS 62239:2008 | Process management for avionics - Preparation of an electronic components management plan |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
| EN 100015-3 : 1993 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: BASIC SPECIFICATION: REQUIREMENTS FOR CLEAN ROOM AREAS |
| IPC J STD 004 : B | REQUIREMENTS FOR SOLDERING FLUXES |
| IPC J STD 033C-1:2014 | HANDLING, PACKING, SHIPPING AND USE OF MOISTURE, REFLOW, AND PROCESS SENSITIVE DEVICES |
| IEC TS 62564-1:2016 | Process management for avionics - Aerospace qualified electronic components (AQEC) - Part 1: Integrated circuits and discrete semiconductors |
| IPC J STD 035 : 0 | ACOUSTIC MICROSCOPY FOR NON-HERMETIC ENCAPSULATED ELECTRONIC COMPONENTS |
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