EN 62572-3:2016
Current
The latest, up-to-date edition.
Fibre optic active components and devices - Reliability standards - Part 3: Laser modules used for telecommunication
03-06-2016
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions, symbols and
abbreviations
4 Laser reliability and quality assurance
procedure
5 Tests
6 Activities
Annex A (informative) - Guidance on testing
in Table 1 and Table 2
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
IEC 62572-3:2014 deals with reliability assessment of laser modules used for telecommunication.
DocumentType |
Standard
|
PublisherName |
European Committee for Standards - Electrical
|
Status |
Current
|
Supersedes |
Standards | Relationship |
I.S. EN 62572-3:2016 | Identical |
BS EN 62572-3:2016 | Identical |
IEC 62572-3:2016 | Identical |
UNE-EN 62572-3:2016 | Identical |
NBN EN 62572-3 : 2016 | Identical |
CEI EN 62572-3 : 2016 | Identical |
DIN EN 62572-3:2017-07 | Identical |
SS-EN 62572-3 : 2016 | Identical |
NEN EN IEC 62572-3 : 2016 | Identical |
SN EN 62572-3:2016 | Identical |
PN EN 62572-3 : 2016 | Identical |
NF EN 62572-3 : 2018 | Identical |
PNE-FprEN 62572-3 | Identical |
EN 61291-2:2016 | Optical amplifiers - Part 2: Single channel applications - Performance specification template |
BS EN 50152-3-2:2016 | Railway applications. Fixed installations. Particular requirements for a.c. switchgear Measurement, control and protection devices for specific use in a.c. traction systems. Current transformers |
BS EN 61291-2:2016 | Optical amplifiers Single channel applications. Performance specification template |
I.S. EN 61291-2:2016 | OPTICAL AMPLIFIERS - PART 2: SINGLE CHANNEL APPLICATIONS - PERFORMANCE SPECIFICATION TEMPLATE |
EN 62149-3:2014 | Fibre optic active components and devices - Performance standards - Part 3: Modulator-integrated laser diode transmitters for 2,5-Gbit/s to 40-Gbit/s fibre optic transmission systems |
BS EN 62149-3:2014 | Fibre optic active components and devices. Performance standards Modulator-integrated laser diode transmitters for 2,5-Gbit/s to 40-Gbit/s fibre optic transmission systems |
IEC 60749-8:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing |
MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
IEC 60749-25:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling |
EN 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC 60749-11:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method |
EN 60749-11:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method |
IEC 60749-26:2013 | Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
EN 60749-10:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
EN 60749-8:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing |
IEC 60749-6:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature |
EN 60749-6:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature |
EN 60749-26:2014 | Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC 60749-10:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock |
IEC TR 62572-2:2008 | Fibre optic active components and devices - Reliability standards - Part 2: Laser module degradation |
EN 60749-25:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
EN 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
IEC 60749-12:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency |
EN 60749-12:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency |
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