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BS 6493-3:1985

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

View Superseded by

Semiconductor devices Mechanical and climatic test methods

Available format(s)

Hardcopy , PDF

Withdrawn date

26-10-2018

Superseded by

BS EN 60749:1999

Language(s)

English

Published date

31-01-1986

£232.00
Excluding VAT

National foreword
Committees responsible
Chapter I: General
1. Scope and purpose
2. Object
3. Terms, definitions and letter symbols
4. Standard atmospheric conditions
5. External visual examination and verification of
     dimensions
6. Electrical measurements
Chapter II: Mechanical test methods
1. Robustness of terminations
1.1 Tensile
1.2 Bending
1.3 Torsion
1.4 Torque
2. Soldering
2.1 Solderability
2.2 Resistance to soldering heat
2.3 Resistance of plastic encapsulated SMDs to the
     combined effect of moisture and soldering heat
3. Vibration (sinusoidal)
4. Shock
5. Acceleration, steady state
6. Bond strength test
6.1 General
6.2 Methods A and B
6.3 Method C
6.4 Method D
6.5 Methods E and F
6.6 Information to be given in the relevant
     specification
7. Die shear strength test
Appendix to Sub-clause 6.2 - Guidance
Chapter III: Climatic test methods
1. Change of temperature
1.1 Rapid change of temperature: two-chamber method
1.2 Rapid change of temperature: two-fluid-bath method
2. Storage (at high temperature)
3. Low air pressure
4. Damp heat, cyclic
5A. Damp heat, steady state
5B. Damp heat, steady state, accelerated
5C. Damp heat, steady state, highly accelerated
6. Composite temperature/humidity cyclic test
7. Sealing
7.1 Bomb pressure test
7.2 Text deleted
7.3 Fine leak detection: radioactive krypton method
7.4 Fine leak detection: tracer gas method with mass
     spectrometer
7.5 Gross leak, perfluorocarbon vapour method using
     electronic detection apparatus
8. Salt mist
9. Thermal intermittence test
10. Internal moisture content measurement by mass
     spectrometry method
Chapter IV: Miscellaneous test methods
1. Flammability tests of plastic-encapsulated devices
1.1 Flammability (internally induced)
1.2 Flammability (externally induced)
2. Permanence of marking

Special requirements for test methods additional to IEC 60068, and certain specific and complete test methods.

Committee
EPL/47
DocumentType
Standard
Pages
42
PublisherName
British Standards Institution
Status
Withdrawn
SupersededBy

BS QC 750005:1987 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diodes
BS QC 750001:1986 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Signal diodes, switching diodes and controlled avalanche diodes
BS QC 790132:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
BS QC 750103:1990 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification
BS QC 790130:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU)
BS CECC 90000:1991 Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
BS IEC 60747-10:1991 Semiconductor devices Generic specification for discrete devices and integrated circuits
BS QC 750110:1990 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Reverse blocking triode thyristors, ambient and case-rated, up to 100 A
BS QC 790303:1994 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC)
BS QC 790110:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits
BS QC 790111:1993 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories
BS QC 750107:1991 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications
BS 9450:1998 Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures). Generic data and methods of test
BS QC 750108:1990 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A
BS EN 116000-3:1996 Harmonized system of quality assessment for electronic components. Generic specification: electromechanical all-or-nothing relays Test and measurement procedures
BS 9400:1970 Specification for integrated electronic circuits and micro-assemblies of assessed quality (qualification approval procedures): generic data and methods of test
BS QC 160000-1:1987 Harmonized system of quality assessment for electronic components. Electrical relays. Generic specification: electromechanical all-or-nothing relays Test and measurement procedures
BS QC 750112:1988 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz
CECC 16000 PT1 : 90 AMD 2 92 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: ELECTROMECHANICAL ALL-OR-NOTHING RELAYS - PART 1: GENERAL
BS QC700000(1991) : 1991 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS
BS QC 790304:1994 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC)
BS QC 760000:1990 Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification
BS QC 790104:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Family specification. Complementary MOS digital integrated circuits, series 4000 B and 4000 UB
BS 9450:1975 Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures): generic data and methods of test
BS QC 750109:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
BS CECC 16000-1:1992 Harmonized system of quality assessment for electronic components. Generic specification: electromechanical all-or-nothing relays General
BS QC 750106:1993 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications
BS QC 750102:1990 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification
BS EN 190000:1996 Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
BS QC 750113:1994 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: reverse blocking triode thyristors, ambient and case-rated, for currents greater than 100 A
BS QC 750104:1991 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications
BS QC 790105:1993 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories
EN 190000:1995 Generic Specification: Monolithic integrated circuits

BS 6458-2.2(1984) : 1984 FIRE HAZARD TESTING FOR ELECTROTECHNICAL PRODUCTS - METHODS OF TEST - NEEDLE FLAME TEST
BS 6493-1.1:1984 Semiconductor devices. Discrete devices General
BS 6493-2.1:1985 Semiconductor devices. Integrated circuits General

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