BS EN 62506:2013
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Methods for product accelerated testing
Hardcopy , PDF
12-01-2024
English
30-09-2013
Committee |
DS/1
|
DevelopmentNote |
Supersedes 10/30238858 DC.
|
DocumentType |
Standard
|
Pages |
92
|
PublisherName |
British Standards Institution
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
IEC 62506:2013 provides guidance on the application of various accelerated test techniques for measurement or improvement of product reliability. Identification of potential failure modes that could be experienced in the use of a product/item and their mitigation is instrumental to ensure dependability of an item. The object of the methods is to either identify potential design weakness or provide information on item dependability, or to achieve necessary reliability/availability improvement, all within a compressed or accelerated period of time. This standard addresses accelerated testing of non-repairable and repairable systems. It can be used for probability ratio sequential tests, fixed duration tests and reliability improvement/growth tests, where the measure of reliability may differ from the standard probability of failure occurrence. This standard also extends to present accelerated testing or production screening methods that would identify weakness introduced into the product by manufacturing error, which could compromise product dependability. Keywords: test techniques for measurement or improvement of product reliability
Standards | Relationship |
IEC 62506:2013 | Identical |
EN 62506 : 2013 | Identical |
IEC 61125:1992 | Unused hydrocarbon based insulating liquids - Test methods for evaluating the oxidation stability |
IEC 60812:2006 | Analysis techniques for system reliability - Procedure for failure mode and effects analysis (FMEA) |
IEC 61649:2008 | Weibull analysis |
IEC 61014:2003 | Programmes for reliability growth |
IEC 62429:2007 | Reliability growth - Stress testing for early failures in unique complex systems |
IEC 62303:2008 | Radiation protection instrumentation - Equipment for monitoring airborne tritium |
EN 60300-3-1:2004 | Dependability management - Part 3-1: Application guide - Analysis techniques for dependability - Guide on methodology |
EN 61649:2008 | Weibull analysis |
IEC TR 62380:2004 | Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment |
IEC 61163-2:1998 | Reliability stress screening - Part 2: Electronic components |
EN 61710:2013 | Power law model - Goodness-of-fit tests and estimation methods |
IEC 61124:2012 | Reliability testing - Compliance tests for constant failure rate and constant failure intensity |
EN 62429:2008 | Reliability growth - Stress testing for early failures in unique complex systems |
IEC 60300-3-1:2003 | Dependability management - Part 3-1: Application guide - Analysis techniques for dependability - Guide on methodology |
IEC 61164:2004 | Reliability growth - Statistical test and estimation methods |
IEC 61703:2016 | Mathematical expressions for reliability, availability, maintainability and maintenance support terms |
IEC 61709:2017 | Electric components - Reliability - Reference conditions for failure rates and stress models for conversion |
IEC 60605-2:1994 | Equipment reliability testing - Part 2: Design of test cycles |
EN 61014:2003 | Programmes for reliability growth |
EN 61709:2017 | Electric components - Reliability - Reference conditions for failure rates and stress models for conversion |
EN 61164:2004 | Reliability growth - Statistical test and estimation methods |
MIL-HDBK-189 Revision C:2011 | RELIABILITY GROWTH MANAGEMENT |
EN 61124:2012 | RELIABILITY TESTING - COMPLIANCE TESTS FOR CONSTANT FAILURE RATE AND CONSTANT FAILURE INTENSITY (IEC 61124:2012) |
IEC 61710:2013 | Power law model - Goodness-of-fit tests and estimation methods |
IEC 60300-3-5:2001 | Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles |
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