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BS 6493-2.1:1985

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Semiconductor devices. Integrated circuits General

Available format(s)

Hardcopy , PDF

Superseded date

30-07-2002

Superseded by

BS IEC 60748-1:2002

Language(s)

English

Published date

06-08-2002

$520.16
Including GST where applicable

National foreword
Committees responsible
Chapter I: Scope and presentation of IEC Publication 748
1 Scope
2 Presentation
Chapter II: Purpose & presentation of Publication 748-1
1 General
2 Purpose
3 Presentation
Chapter III: Purpose, presentation and requirements on
the contents of publications 748-2, 748-3, etc. (under
consideration)
Chapter IV: Terminology, general
1 General terms
2 Types of devices
3 Clamping characteristics of integrated circuits
4 Technological concepts
5 Concepts for particular device types of film
   integrated circuits and hybrid film integrated
   circuits
Chapter V: Letter symbols, general
1 Basic letters
2 Subscripts for digital integrated circuits
   2.1 Voltages and currents
   2.2 Switching times
3 Subscripts for analogue integrated circuits
Chapter VI: Essential ratings and characteristics,
general
1 Introduction
2 Standard format for the presentation of published
   data and method for describing essential ratings
   and characteristics and function specification of
   integrated circuits
   2.1 Standard format for the presentation of published
        data
   2.2 Method for describing essential ratings and
        characteristics and function specification of
        integrated circuits
3 Basic "rating" definitions
4 Definitions of cooling conditions
5 List of preferred temperatures
6 List of preferred voltages
   6.1 List of preferred nominal voltages for recommended
        operating conditions
   6.2 Tolerances on voltages
7 Mechanical ratings, characteristics and other data
8 Production spread and compliance
9 Printed wiring and printed circuits
Chapter VII: Measuring methods, general
1 Basic requirements
   1.1 Introduction
   1.2 General precautions
2 Specific requirements on the measuring methods
3 Numbering system for measuring methods
   3.1 Numbering principle
   3.2 Numbering list of measuring methods for integrated
        circuits
   3.3 Application matrices
   3.4 Updating
Chapter VIII: Acceptance and reliability of integrated
circuits
Section One - General
Section Two - General principles
(under consideration)
Section Three - Electrical endurance tests
1 Purpose and presentation
2 General requirements
   2.1 Conditions for electrical tests
   2.2 Duration of test
   2.3 Failure-defining characteristics and measurements
   2.4 Failure criteria
   2.5 Precautions
3 Specific requirements. General
   3.1 List of endurance tests
   3.2 Conditions for endurance tests
   3.3 Failure-defining characteristics and failure
        criteria for acceptance after endurance tests
   3.4 Failure-defining characteristics and failure
        criteria for reliability (under consideration)
   3.5 Procedure in case of a testing error
Chapter IX: Electrostatic sensitive devices
(see Publication 747-1, Chapter IX)

General recommendations for integrated circuits.

Committee
EPL/47
DevelopmentNote
Also numbered as IEC 60748-1 Supersedes BS 3363(1980), BS 3363:SUPP1(1981), BS 3363:SUPP2(1981), 87/23034 DC and 87/32332 DC (08/2002)
DocumentType
Standard
Pages
38
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
IEC 60748-1:1984 Identical

BS 6493-2.2(1986) : 1986 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS FOR DIGITAL INTEGRATED CIRCUITS
BS CECC 90000:1991 Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
BS IEC 60747-10:1991 Semiconductor devices Generic specification for discrete devices and integrated circuits
BS QC 790303:1994 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC)
BS EN 117000:1997 Harmonized system of quality assessment for electronic components. Generic specification. Solid state all-or-nothing relays. Generic data and methods of test
BS 6493-1.1:1984 Semiconductor devices. Discrete devices General
BS 6493-3:1985 Semiconductor devices Mechanical and climatic test methods
BS CECC 90200:1988 Harmonized system of quality assessment for electronic components: sectional specification: analogue monolithic integrated circuits
BS CECC 90300:1988 Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits
BS QC 790202:1991 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers
BS 6493-2.3:1987 Semiconductor devices. Integrated circuits Recommendations for analogue integrated circuits
BS QC700000(1991) : 1991 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS
BS QC 790304:1994 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC)
BS QC 760000:1990 Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification
BS 6493-2.4(1989) : 1989 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS INTERFACE INTEGRATED CIRCUITS
BS CECC 90115:1994 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits
BS EN 190000:1996 Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
EN 190000:1995 Generic Specification: Monolithic integrated circuits

BS 6493-1.1:1984 Semiconductor devices. Discrete devices General
BS 3939-12:1985 Guide for graphical symbols for electrical power, telecommunications and electronics diagrams Binary logic elements
BS 6493-2.4(1989) : 1989 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS INTERFACE INTEGRATED CIRCUITS
BS 6493-2.2(1986) : 1986 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS FOR DIGITAL INTEGRATED CIRCUITS
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
BS 4200-3:1979 Guide on the reliability of electronic equipment and parts used therein Presentation of reliability data on electronic components (or parts)
BS 6493-2.3:1987 Semiconductor devices. Integrated circuits Recommendations for analogue integrated circuits

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