SAE AS 6171/7 : 2016
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY ELECTRICAL TEST METHODS
Hardcopy , PDF
04-03-2024
English
30-10-2016
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1. SCOPE
2. REFERENCES
3. MATERIAL CONTROL/ESD HANDLING/TEST HANDLING
4. REQUIREMENTS
5. RELATED TESTS
6. DATA/COMMUNICATION AND TEST LAB REPORTING
7. APPENDIX SUMMARY
8. NOTES
APPENDIX A - QUESTIONNAIRE
APPENDIX B - REQUIRED LABORATORY PROCEDURES
APPENDIX C - TABLE C1 - EXAMPLES OF ACTIVE DEVICE KEY
ELECTRICAL TEST PARAMETERS
APPENDIX D - TABLE D1 - EXAMPLES OF PASSIVE DEVICES KEY
TEST ELECTRICAL PARAMETERS
APPENDIX E - A PROFICIENCY SCHEME EXAMPLE
APPENDIX F - TEST PLAN OUTLINE
APPENDIX G - TEST REPORT
APPENDIX H - SAMPLE ELECTRICAL TEST DATALOG FILE
Gives guidance and requirements on the electrical test procedures to be employed by the Test Laboratory (Lab) for electrical, electronic and electro-mechanical (EEE) parts for suspect counterfeit (SC) part detection.
| Committee |
G-19A
|
| DocumentType |
Test Method
|
| Pages |
32
|
| PublisherName |
SAE International
|
| Status |
Superseded
|
| SupersededBy |
| 18/30373170 DC : 0 | BS EN 62668-2 - PROCESS MANAGEMENT FOR AVIONICS - COUNTERFEIT PREVENTION - PART 2: MANAGING ELECTRONIC COMPONENTS FROM NON-FRANCHISED SOURCES |
| IEC TS 62668-2:2016 | Process management for avionics - Counterfeit prevention - Part 2: Managing electronic components from non-franchised sources |
| SAE AS 6171 : 2016 | TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS |
| PD IEC/TS 62668-2:2016 | Process management for avionics. Counterfeit prevention Managing electronic components from non-franchised sources |
| SAE AS 9003 : 2012 | INSPECTION AND TEST QUALITY SYSTEMS, REQUIREMENTS FOR AVIATION, SPACE, AND DEFENSE ORGANIZATIONS |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| SAE AS 6171 : 2016 | TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-PRF-38534 Revision J:2015 | HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
| SAE ARP 9009 : 2006 | AEROSPACE CONTRACT CLAUSES |
| SAE AS 9100D : 2016 | QUALITY MANAGEMENT SYSTEMS - REQUIREMENTS FOR AVIATION, SPACE AND DEFENSE ORGANIZATIONS |
| ISO 9001:2015 | Quality management systems — Requirements |
| ISO 9000:2015 | Quality management systems — Fundamentals and vocabulary |
| MIL-HDBK-103 Revision BA:2017 | LIST OF STANDARD MICROCIRCUIT DRAWINGS |
| SAE AS 9120 : 2016 | QUALITY MANAGEMENT SYSTEMS - REQUIREMENTS FOR AVIATION, SPACE AND DEFENSE DISTRIBUTORS |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-STD-202 Revision H:2015 | ELECTRONIC AND ELECTRICAL COMPONENT PARTS |
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