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PD IEC TS 62098:2001

Current

Current

The latest, up-to-date edition.

Evaluation methods for microprocessor-based instruments

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

19-04-2001

£232.00
Excluding VAT

FOREWORD
INTRODUCTION
Clause
1 General
  1.1 Scope
  1.2 Normative references
  1.3 Definitions
2 Developments in instrumentation
3 Evaluation considerations
  3.1 System approach
  3.2 Evaluation matrix
  3.3 Boundary area (interfaces)
4 Evaluation technology
  4.1 Instrument analysis
  4.2 Instruments on a digital communication link
  4.3 Identification of instrument properties
  4.4 Influencing conditions and related tests
Annex A (normative) Considerations on measuring the
        accuracy
Annex B (informative) Offset measurements of controllers
Annex C (informative) Resolution and loss of integral
        action
Annex D (informative) Reset wind-up protection
Annex E (informative) Practical example of evaluation
        matrix

Aims at providing background information for developing evaluation methods for microprocessor-based instruments. Depending on the application of an instrument, the user may have to define further functions and properties or influencing conditions.

Committee
GEL/65/2
DevelopmentNote
Also numbered as IEC TS 62098:2000 (05/2001)
DocumentType
Standard
Pages
42
PublisherName
British Standards Institution
Status
Current

This Technical Specification aims at providing background information for developing evaluation methods for microprocessor-based instruments. An evaluation starts with analysis of the instrument in terms of the external and internal information flows from and to the process, the human operator and external systems. Main function blocks in the instrument are then identified. By using the checklists given in 4.2 and 4.3, the functions and properties that may be embedded in the function blocks of the instrument to be evaluated can be identified.

Standards Relationship
IEC TS 62098:2000 Identical

IEC 60050-351:2013 International Electrotechnical Vocabulary (IEV) - Part 351: Control technology
IEC 60770-1:2010 Transmitters for use in industrial-process control systems - Part 1: Methods for performance evaluation

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