• There are no items in your cart
We noticed you’re not on the correct regional site. Switch to our AMERICAS site for the best experience.
Dismiss alert

ISO 9276-3:2008

Current

Current

The latest, up-to-date edition.

Representation of results of particle size analysis — Part 3: Adjustment of an experimental curve to a reference model

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

24-06-2008

£119.00
Excluding VAT

ISO 9276-3:2008 specifies methods for the adjustment of an experimental curve to a reference model with respect to a statistical background. Furthermore, the evaluation of the residual deviations, after the adjustment, is also specified. The reference model can also serve as a target size distribution for maintaining product quality.

ISO 9276-3:2008 specifies procedures that are applicable to the following reference models: a) normal distribution (Laplace-Gauss): powders obtained by precipitation, condensation or natural products (pollens); b) log-normal distribution (Galton MacAlister): powders obtained by grinding or crushing; c) Gates-Gaudin-Schuhmann distribution (bilogarithmic): analysis of the extreme values of the fine particle distributions; d) Rosin-Rammler distribution: analysis of the extreme values of the coarse particle distributions; e) any other model or combination of models, if a non-linear fit method is used.

ISO 9276-3:2008 can substantially support product quality assurance or process optimization related to particle size distribution analysis.

DevelopmentNote
Supersedes ISO/DIS 9276-3. (06/2008)
DocumentType
Standard
Pages
23
PublisherName
International Organization for Standardization
Status
Current

Standards Relationship
NEN ISO 9276-3 : 2008 Identical
BS ISO 9276-3:2008 Identical
IS 18657 : Part 3 : 2024 Identical

ISO/TS 14411-1:2017 Preparation of particulate reference materials — Part 1: Polydisperse material based on picket fence of monodisperse spherical particles
14/30304007 DC : 0 BS EN 62899-2-1 ED.1 - PRINTED ELECTRONICS - MATERIALS - PART 2-1: CONDUCTIVE MATERIAL INK
BS ISO 9276-2:2014 Representation of results of particle size analysis Calculation of average particle sizes/diameters and moments from particle size distributions
ISO 9276-2:2014 Representation of results of particle size analysis — Part 2: Calculation of average particle sizes/diameters and moments from particle size distributions
17/30336222 DC : 0 BS EN 62899-203 - PRINTED ELECTRONICS - PART 203 - MATERIALS - SEMICONDUCTOR INK
PD ISO/TS 14411-1:2017 Preparation of particulate reference materials Polydisperse material based on picket fence of monodisperse spherical particles
ISO/TS 16195:2013 Nanotechnologies Guidance for developing representative test materials consisting of nano-objects in dry powder form

ISO 9276-1:1998 Representation of results of particle size analysis — Part 1: Graphical representation
ISO 9276-5:2005 Representation of results of particle size analysis Part 5: Methods of calculation relating to particle size analyses using logarithmic normal probability distribution
ISO/TR 13425:2006 Guidelines for the selection of statistical methods in standardization and specification
ISO 9276-2:2014 Representation of results of particle size analysis — Part 2: Calculation of average particle sizes/diameters and moments from particle size distributions

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.