ISO 24236:2005
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The latest, up-to-date edition.
Surface chemical analysis Auger electron spectroscopy Repeatability and constancy of intensity scale
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19-04-2005
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ISO 24236:2005 specifies a method for evaluating the constancy and repeatability of the intensity scale of Auger electron spectrometers, for general analytical purposes, using an electron gun with a beam energy of 2 keV or greater. It is only applicable to instruments that incorporate an ion gun for sputter cleaning. It is not intended to be a calibration of the intensity/energy response function. That calibration may be made by the instrument manufacturer or other organization. The present procedure provides data to evaluate and confirm the accuracy with which the intensity/energy response function remains constant with instrument usage. Guidance is given on some of the instrumental settings that may affect this constancy.
| DevelopmentNote |
Supersedes ISO/DIS 24236 (04/2005)
|
| DocumentType |
Standard
|
| Pages |
14
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| NF ISO 24236 : 2006 | Identical |
| BS ISO 24236:2005 | Identical |
| SAC GB/T 29558 : 2013 | Identical |
| NEN ISO 24236 : 2005 | Identical |
| ISO/TR 10993-22:2017 | Biological evaluation of medical devices — Part 22: Guidance on nanomaterials |
| BS ISO 15471:2004 | Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters |
| ISO 20903:2011 | Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Methods used to determine peak intensities and information required when reporting results |
| ASTM E 1016 : 2007 : R2012 : EDT 1 | Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers |
| ISO 23830:2008 | Surface chemical analysis — Secondary-ion mass spectrometry — Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry |
| 05/30124112 DC : DRAFT JULY 2005 | ISO 20903 - SURFACE CHEMICAL ANALYSIS - AUGER ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPY - METHODS USED TO DETERMINE PEAK INTENSITIES AND INFORMATION REQUIRED WHEN REPORTING RESULTS |
| ISO 15471:2016 | Surface chemical analysis Auger electron spectroscopy Description of selected instrumental performance parameters |
| ASTM E 1016 : 2007 | Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers |
| PD ISO/TR 10993-22:2017 | Biological evaluation of medical devices Guidance on nanomaterials |
| BS ISO 23830:2008 | Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry |
| BS ISO 20903:2011 | Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results |
| ISO 18118:2015 | Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials |
| ISO 7873:1993 | Control charts for arithmetic average with warning limits |
| ISO 15472:2010 | Surface chemical analysis X-ray photoelectron spectrometers Calibration of energy scales |
| ISO 17973:2016 | Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis |
| ISO 7870:1993 | Control charts General guide and introduction |
| ISO 17974:2002 | Surface chemical analysis High-resolution Auger electron spectrometers Calibration of energy scales for elemental and chemical-state analysis |
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