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IEC 62884-1:2017

IEC 62884-1:2017

Current

Current

The latest, up-to-date edition.

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English, English - French

Published date

08-06-2017

Publisher

International Electrotechnical Committee

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Hardcopy - English
PDF - English
PDF 3 Users - English
PDF 5 Users - English
PDF 9 Users - English
Hardcopy - English - French
PDF - English - French
PDF 3 Users - English - French
PDF 5 Users - English - French
PDF 9 Users - English - French
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IEC 62884-1:2017 specifies the measurement techniques for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DROs) and oscillators using FBAR (hereinafter referred to as "Oscillator")

Committee
TC 49
DevelopmentNote
Stability Date: 2019. (06/2017)
DocumentType
Standard
Pages
61
PublisherName
International Electrotechnical Committee
Status
Current

IEC 62884-3:2018 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
BS EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
EN 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
I.S. EN 60679-1:2017 PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
I.S. EN 62884-2:2017 MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 2: PHASE JITTER MEASUREMENT METHOD
CEI EN 60679-1 : 2009 PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
17/30337173 DC : 0 BS EN 62884-4 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 4: SHORT-TERM FREQUENCY STABILITY TEST METHODS
BS EN 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method
EN IEC 62884-3:2018 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods
IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification

ISO 80000-4:2006 Quantities and units Part 4: Mechanics
IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
IEC 60068-2-58:2015+AMD1:2017 CSV Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IEC 61837-1:2012 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
IEC 60679-4:1997 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
IEC 60469:2013 Transitions, pulses and related waveforms - Terms, definitions and algorithms
IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
IEC 61837-2:2011+AMD1:2014 CSV Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part2: Ceramic enclosures
IEC TR 60068-3-12:2014 Environmental testing - Part 3-12: Supporting documentation and guidance - Method to evaluate a possible lead-free solder reflow temperature profile
IEC 60679-5:1998 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
IEC 61837-4:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
IEC 60749-27:2006+AMD1:2012 CSV Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
IEC 61019-1:2004 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
IEC 60068-2-31:2008 Environmental testing - Part 2-31: Tests - Test Ec: Rough handling shocks, primarily for equipment-type specimens
IEC 60068-2-64:2008 Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance
IEC 61019-2:2005 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
IEC 60749-26:2013 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-10:2005 Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth
IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
IEC 61000-4-2:2008 Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test
ISO 80000-1:2009 Quantities and units — Part 1: General
IEC 60050-561:2014 International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification
IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60679-3:2012 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
IEC 60679-2:1981 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
IEC 60068-2-52:2017 Environmental testing - Part 2-52: Tests - Test Kb: Salt mist, cyclic (sodium chloride solution)
IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)

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