IEC 61261-2:1994
Current
The latest, up-to-date edition.
Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
11-03-1994
Important note : All end users must be registered with an Account prior to user licenses being assigned.Prescribes preferred ratings and characteristics and selects from the Generic Specification (IEC 61261-1) the appropriate Quality Assessment procedures, tests and measuring methods and gives general performance requirements for this type of filter.
| Committee |
TC 49
|
| DevelopmentNote |
Stability Date: 2017. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
43
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| BS EN 60368-2-2:1999 | Piezoelectric filters. Guide to the use of piezoelectric filters Piezoelectric ceramic filters |
| BS EN 62047-7:2011 | Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection |
| I.S. EN 62047-7:2011 | SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION |
| IEC 62047-7:2011 | Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection |
| 08/30172394 DC : DRAFT APR 2008 | BS EN 62047-7 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS FBAR FILTER & DUPLEXER |
| CEI EN 62047-7 : 2012 | SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION |
| I.S. EN 60368-2-2:1999 | PIEZOELECTRIC FILTERS - PART 2: GUIDE TO THE USE OF PIEZOELECTRIC FILTERS - SECTION 2: PIEZOELECTRIC CERAMIC FILTERS |
| IEC 61261-2-1:1994 | Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E |
| EN 60368-2-2:1999 | Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters |
| EN 62047-7 : 2011 | SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION |
| ISO 3:1973 | Preferred numbers Series of preferred numbers |
| IEC 60368-1:2000+AMD1:2004 CSV | Piezoelectric filters of assessed quality - Part 1: Genericspecification |
| IEC 61261-1:1994 | Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval |
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