IEC 60862-2:2012
Current
The latest, up-to-date edition.
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English, English - French
07-05-2012
IEC 60862-2:2012 gives practical guidance on the use of SAW filters which are used in telecommunications, measuring equipment, radar systems and consumer products. IEC 60862-1 should be referred to for general information, standard values and test conditions. This part of IEC 60862 includes various kinds of filter configuration, of which the operating frequency range is from approximately 10 MHz to 3 GHz and the relative bandwidth is about 0,02 % to 50 % of the centre frequency. It is not the aim of this standard to explain theory, nor to attempt to cover all the eventualities which may arise in practical circumstances. This standard draws attention to some of the more fundamental questions, which should be considered by the user before he places an order for a SAW filter for a new application. Such a procedure will be the user's insurance against unsatisfactory performance. This edition includes the following significant technical changes with respect to the previous edition:
- Clause 3 "Terms and definitions" has been deleted to be included in the next edition of IEC 60862-1;
- the tapered IDT filter and the RSPUDT filter have been added to the clause of SAW transversal filters. Also DART, DWSF and EWC have been added as variations of SPUDT;
- the balanced connection has been added to the subclause of coupled resonator filters;
- recent substrate materials have been described;
- a subclause about packaging of SAW filters has been added.
Committee |
TC 49
|
DevelopmentNote |
Stability Date: 2019. (09/2017)
|
DocumentType |
Standard
|
Pages |
128
|
PublisherName |
International Electrotechnical Committee
|
Status |
Current
|
Supersedes |
Standards | Relationship |
DIN EN 60862-2:2013-01 | Identical |
NBN EN 60862-2 : 2012 | Identical |
NEN EN IEC 60862-2 : 2012 | Identical |
PN EN 60862-2 : 2013 | Identical |
BS EN 60862-2:2012 | Identical |
CEI EN 60862-2 : 2013 | Identical |
EN 60862-2:2012 | Identical |
NF EN 60862-2 : 2012 | Identical |
PNE-FprEN 60862-2 | Identical |
UNE-EN 60862-2:2012 | Identical |
DIN IEC 60862-2:1992-07 | Identical |
UNE-EN 60862-2:2003 | Identical |
BS EN 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality Generic specification |
09/30207175 DC : 0 | BS EN 62276 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHOD |
03/108069 DC : DRAFT MAY 2003 | IEC 62276 ED.1 - SINGLE CRYSTAL WAFERS APPLIED FOR SURFACE ACOUSTIC WAVE DEVICE - SPECIFICATION AND MEASURING METHOD |
02/203601 DC : DRAFT MAR 2002 | IEC 60862-3. ED.2 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION. SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES |
I.S. EN 62604-1:2015 | SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
DD IEC/TS 61994-2:2011 | Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary Piezoelectric and dielectric filters |
PD IEC/PAS 62276:2002 | Single crystal wafers applied for surface acoustic wave device. Specification and measuring method |
10/30240248 DC : 0 | BS EN 60862-1 - SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
CEI EN 62604-2 : 2012 | SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE |
I.S. EN 61837-3:2015 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURES |
EN 61837-2:2011/A1:2014 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES (IEC 61837-2:2011/A1:2014) |
EN 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
EN 62604-1:2015 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification |
15/30318551 DC : 0 | BS EN 62276 ED. 3.0 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATION - SPECIFICATIONS AND MEASURING METHODS |
08/30192315 DC : 0 | BS EN 62604-2 - SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS - PART 2: GUIDE TO THE USE |
BS EN 60862-3:2003 | Surface acoustic wave (SAW) filters of assessed quality Standard outlines |
BS EN 62047-7:2011 | Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection |
I.S. EN 62604-2:2012 | SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE (IEC 62604-2:2011 (EQV)) |
IEC TS 61994-2:2011 | Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters |
IEC 62604-2:2017 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use |
IEC 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
IEC 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
13/30278807 DC : 0 | BS EN 61837-3 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTI0N - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURE |
IEC PAS 62276:2001 | Single crystal wafers applied for surface acoustic wave device - Specification and measuring method |
EN IEC 62604-2:2018 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use |
I.S. EN 60862-3:2003 | SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES |
I.S. EN 62047-7:2011 | SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION |
BS EN 62604-1:2015 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification |
12/30252220 DC : DRAFT MAR 2012 | BS EN 62604-1 - SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS - PART 1: GENERIC SPECIFICATION |
I.S. EN 61837-2:2011 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
09/30200793 DC : 0 | BS EN 61994-2 ED.2 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - GLOSSARY - PART 2: PIEZOELECTRIC AND DIELECTRIC FILTERS |
BS EN 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods |
I.S. EN IEC 62604-2:2018 | SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE |
BS EN 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures |
I.S. EN 62276:2016 | SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS |
IEC 62604-1:2015 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification |
IEC 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
IEC 62047-7:2011 | Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection |
EN 60862-3:2003 | Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines |
EN 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
EN 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
09/30200395 DC : 0 | BS EN 61837-2 ED. 2 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
08/30172394 DC : DRAFT APR 2008 | BS EN 62047-7 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS FBAR FILTER & DUPLEXER |
BS EN 62604-2:2012 | Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality Guidelines for the use |
CEI EN 62047-7 : 2012 | SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION |
I.S. EN 60862-1:2015 | SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
BS EN 61837-2 : 2011 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
IEC 60862-3:2003 | Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines |
EN 62047-7 : 2011 | SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION |
IEC 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
IEC 61019-2:2005 | Surface acoustic wave (SAW) resonators - Part 2: Guide to the use |
IEC 60368-2-1:1988 | Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters |
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