IEC 60679-1:2017
Current
Current
The latest, up-to-date edition.
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
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English - French, English
Published date
26-07-2017
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IEC 60679-1:2017 specifies general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either capability approval or qualification approval procedures.
NOTE Dielectric Resonator Oscillators (DRO) and oscillators using FBAR are under consideration.
This edition includes the following significant technical changes with respect to the previous edition:
a) the title has been changed;
b) additional matters related to oscillator using SAW or MEMS resonator in "Terms, definitions and general information" have been included;
c) measurement methods of IEC 60679-1:2007 have been removed (they will be moved to IEC 62884 series);
d) the content of Annex A has been extended;
e) a new term and definition DIXO (Digital interfaced Crystal Oscillator) has been added;
f) a new term and definition SSXO (Spread Spectrum Crystal Oscillator) has been added;
g) Annex D has been added.
| Committee |
TC 49
|
| DevelopmentNote |
Stability Date: 2022. (07/2017)
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-7178-0
|
| Pages |
73
|
| ProductNote |
THIS STANDARD ALSO REFERS - IEC 60617
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IS 9018 : Part 1 : 2022 | Identical |
| BS EN 60679-1:2007 | Identical |
| CEI EN 60679-1 : 2009 | Identical |
| DIN EN 60679-1:2013-08 (Draft) | Identical |
| I.S. EN 60679-1:2007 | Identical |
| NF EN 60679-1:2017 | Identical |
| UNE-EN 60679-1:2017 | Identical |
| UNE-EN 60679-1:2007 | Identical |
| BS EN 60679-1:2017 | Identical |
| DIN 45174-2:1987-05 | Corresponds |
| I.S. EN 60679-1:2017 | Identical |
| DIN 45174-1:1985-01 | Corresponds |
| EN 60679-1:2017 | Identical |
| PN EN 60679-1 : 2018 | Identical |
| CEI EN 60679-1 : 3ED 2018 | Identical |
| NEN EN IEC 60679-1 : 2017 | Identical |
| NF EN 60679-1 : 2013 | Identical |
| PNE-prEN 60679-1:2016 | Identical |
| IEC 62884-3:2018 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods |
| 15/30325282 DC : 0 | BS EN 62884-1 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETIRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
| I.S. EN 61837-3:2015 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURES |
| BS EN 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement |
| BS EN 60747-16-5:2013 | Semiconductor devices Microwave integrated circuits. Oscillators |
| DD IEC PAS 60679-6 : DRAFT MAY 2008 | QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 6: PHASE JITTER MEASUREMENT METHOD FOR QUARTZ CRYSTAL OSCILLATORS AND SAW OSCILLATORS - APPLICATION GUIDE |
| DIN 45174-1:1985-01 | QUARTZ CRYSTAL CONTROLLED OSCILLATORS; TERMS AND DEFINITIONS |
| EN 61837-2:2011/A1:2014 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES (IEC 61837-2:2011/A1:2014) |
| IEC 60679-3:2012 | Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections |
| EN 60679-5:1998 | Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval |
| EN 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
| EN 60679-3:2013 | Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections |
| BS EN 169000:1993 | Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators |
| BS EN 60679-6:2011 | Quartz crystal controlled oscillators of assessed quality Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines |
| DIN 45175-3:1987-05 | QUARTZ CRYSTAL CONTROLLED OSCILLATORS; CHARACTERISTICS OF QUARTZ CRYSTAL CONTROLLED OSCILLATORS; CHECK LIST |
| EN 62884-2:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method |
| EN 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
| NF EN 60679-6 : 2011 | QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 6: PHASE JITTER MEASUREMENT METHOD FOR QUARTZ CRYSTAL OSCILLATORS AND SAW OSCILLATORS - APPLICATION GUIDELINES |
| IEC 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
| 17/30337173 DC : 0 | BS EN 62884-4 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 4: SHORT-TERM FREQUENCY STABILITY TEST METHODS |
| DD IEC TS 61994-3 : DRAFT AUG 2011 | PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC DEVICES AND ASSOCIATED MATERIALS FOR FREQUENCY CONTROL, SELECTION AND DETECTION - GLOSSARY - PART 3: PIEZOELECTRIC AND DIELECTRIC OSCILLATORS |
| 13/30278807 DC : 0 | BS EN 61837-3 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTI0N - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURE |
| BS EN 60679-4-1:1998 | Quartz crystal controlled oscillators of assessed quality Blank detail specification. Capability approval |
| CEI EN 62884-1 : 1ED 2018 | MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
| BS EN 62884-2:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method |
| I.S. EN 62884-1:2017 | MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
| IEC PAS 60679-6:2008 | Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide |
| EN 60747-16-5:2013 | Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators |
| 09/30198258 DC : 0 | BS EN 60679-3 ED.3 - QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS |
| I.S. EN 61837-2:2011 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
| I.S. EN 62884-2:2017 | MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 2: PHASE JITTER MEASUREMENT METHOD |
| I.S. EN 60679-3:2013 | QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS (IEC 60679-3:2012 (EQV)) |
| I.S. EN 60747-16-5:2013 | SEMICONDUCTOR DEVICES - PART 16-5: MICROWAVE INTEGRATED CIRCUITS - OSCILLATORS (IEC 60747-16-5:2013 (EQV)) |
| BS EN 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures |
| IEC TS 61994-3:2011 | Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators |
| IEC 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
| IEC 60679-5:1998 | Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval |
| IEC 60679-4:1997 | Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval |
| IEC 60679-6:2011 | Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines |
| 09/30200395 DC : 0 | BS EN 61837-2 ED. 2 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
| BS EN 60679-3:2013 | Quartz crystal controlled oscillators of assessed quality Standard outlines and lead connections |
| 02/203179 DC : DRAFT FEB 2002 | IEC 61994-3 TS. ED.1 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - GLOSSARY - PART 3: PIEZOELECTRIC OSCILLATORS |
| 11/30243576 DC : DRAFT FEB 2011 | BS EN 62643-1 - ELECTROSTATIC MICRO ELECTRO MECHANICAL SYSTEMS (MEMS) OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| CEI EN 60747-16-5 : 2014 | SEMICONDUCTOR DEVICES - PART 16-5: MICROWAVE INTEGRATED CIRCUITS - OSCILLATORS |
| CEI EN 60679-3 : 2014 | QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS |
| BS EN 60679-4:1998 | Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval |
| 08/30191168 DC : DRAFT OCT 2008 | BS EN 60679-6 - QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 6: PHASE JITTER MEASUREMENT METHOD FOR QUARTZ CRYSTAL OSCILLATORS AND SAW OSCILLATORS - APPLICATION GUIDE |
| BS EN 60679-5:1998 | Quartz crystal controlled oscillators of assessed quality Sectional specification. Qualification approval |
| EN IEC 62884-3:2018 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods |
| BS EN 61837-2 : 2011 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
| I.S. EN 60679-6:2011 | QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 6: PHASE JITTER MEASUREMENT METHOD FOR QUARTZ CRYSTAL OSCILLATORS AND SAW OSCILLATORS - APPLICATION GUIDELINES |
| EN 60679-4:1998 | Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval |
| EN 60679-6:2011 | Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines |
| IEC 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
| ATIS 0900101 : 2013 | SYNCHRONIZATION INTERFACE STANDARD |
| IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| IEC 61837-1:2012 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines |
| IEC 61340-5-1:2016 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements |
| IEC 60679-4:1997 | Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval |
| IEC 60469:2013 | Transitions, pulses and related waveforms - Terms, definitions and algorithms |
| IEC TR 61000-4-1:2016 | Electromagnetic compatibility (EMC) - Part 4-1: Testing and measurement techniques - Overview of IEC 61000-4 series |
| IEC 61837-2:2011+AMD1:2014 CSV | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part2: Ceramic enclosures |
| IEC 60679-5:1998 | Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval |
| IEC 61837-4:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines |
| IEC 60749-27:2006+AMD1:2012 CSV | Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) |
| IEC 61019-1:2004 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| IEC 60068-2-64:2008 | Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance |
| ATIS 0900105.03 : 2013 | SYNCHRONOUS OPTICAL NETWORK - (SONET) - JITTER NETWORK INTERFACES |
| GR 253 CORE : ISSUE 5 | SYNCHRONOUS OPTICAL NETWORK (SONET) TRANSPORT SYSTEMS: COMMON GENERIC CRITERIA |
| IEC 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
| IEC 61019-2:2005 | Surface acoustic wave (SAW) resonators - Part 2: Guide to the use |
| IEC 60749-26:2013 | Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
| IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
| ISO 80000-1:2009 | Quantities and units — Part 1: General |
| IEC 60050-561:2014 | International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
| IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
| IEC 60748-2:1997 | Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits |
| IEC 60679-3:2012 | Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections |
| IEC 60679-2:1981 | Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators |
| MIL-PRF-55310 Revision E:2006 | OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR |
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