I.S. EN 61837-3:2015
Current
The latest, up-to-date edition.
SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURES
Hardcopy , PDF
English
01-01-2015
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
National Foreword
FOREWORD
1 Scope
2 Normative references
3 Configuration of enclosures
4 Designation of types
5 Metal enclosure dimensions
6 Lead connections
7 Designation of metal enclosures
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Defines the standard outlines and terminal lead connections as they apply to SMDs for frequency control and selection in metal enclosures and is based on IEC 61240 which standardized layout rules of outline drawings of the surface-mounted devices.
DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
DocumentType |
Standard
|
Pages |
54
|
PublisherName |
National Standards Authority of Ireland
|
Status |
Current
|
Standards | Relationship |
NBN EN 61837-3 : 2016 | Identical |
DIN EN 61837-3:2016-04 | Identical |
EN 61837-3:2015 | Identical |
BS EN 61837-3:2015 | Identical |
NF EN 61837-3 : 2016 | Identical |
IEC 60191-6:2009 | Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages |
IEC 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
ISO 1101:2017 | Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out |
IEC 60368-1:2000+AMD1:2004 CSV | Piezoelectric filters of assessed quality - Part 1: Genericspecification |
IEC 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
IEC 60368-3:2010 | Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections |
IEC 61240:2016 | Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules |
IEC 60122-2:1983 | Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection |
IEC 60862-2:2012 | Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use |
IEC 60862-3:2003 | Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines |
IEC 60368-2-2:1996 | Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters |
IEC 60679-3:2012 | Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections |
IEC 60679-2:1981 | Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators |
IEC 61019-3:1991 | Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections |
IEC 60368-2-1:1988 | Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters |
IEC 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
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