I.S. EN 61193-2:2007
Current
The latest, up-to-date edition.
QUALITY ASSESSMENT SYSTEMS - PART 2: SELECTION AND USE OF SAMPLING PLANS FOR INSPECTION OF ELECTRONIC COMPONENTS AND PACKAGES
Hardcopy , PDF
English
01-01-2007
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Sampling system
4.1 Formation and identification of lots
4.2 Drawing of samples
4.2.1 Selection of sample items
4.2.2 Process of sampling
4.3 Sampling plans
4.3.1 Inspection level
4.3.2 Sampling plan for normal inspection
4.3.3 Acceptance number
4.3.4 Tightened or reduced inspection
5 Acceptance and rejection
5.1 Acceptability criteria
5.2 Disposition of rejected lots
6 Statistical verified quality limit (SVQL)
6.1 General
6.2 Calculation of the SVQL
Annex A (informative) - Estimation of the statistical verified
quality limit (SVQL) in nonconforming
items per million (x10[-6]) at a confidence
limit 60 %
Annex B (informative) - Relationship between this standard and ISO
2859-1
Annex C (informative) - Example of application of this standard
(lot-by-lot inspection of assessment
level EZ in IEC/TC 40)
Annex ZA (normative) - Normative references to international
publications with their corresponding
European publications
Bibliography
Applicable to the inspection of electronic components, packages, and also modules for use in electronic and electric equipment.
DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
DocumentType |
Standard
|
Pages |
28
|
PublisherName |
National Standards Authority of Ireland
|
Status |
Current
|
Standards | Relationship |
BS EN 61193-2:2007 | Identical |
IEC 61193-2:2007 | Identical |
NF EN 61193-2 : 2006 PR | Identical |
EN 61193-2 : 2007 | Identical |
IEC 62421:2007 | Electronics assembly technology - Electronic modules |
IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
ISO 3534-2:2006 | Statistics — Vocabulary and symbols — Part 2: Applied statistics |
IEC 60194:2015 | Printed board design, manufacture and assembly - Terms and definitions |
EN 60194:2006 | Printed board design, manufacture and assembly - Terms and definitions |
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