I.S. EN 60749-11:2002
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 11: RAPID CHANGE OF TEMPERATURE - TWO-FLUID-BATH METHOD
Hardcopy , PDF
English
01-01-2002
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Specifies the rapid change of temperature test method and the two-fluid-bath method. Also applicable to all semiconductor devices.
DevelopmentNote |
Supersedes I.S. EN 60749. NSAI reissued 2002 PDF dated 19.02.2015 with IEC Corrigenda incorporated. (06/2017)
|
DocumentType |
Standard
|
Pages |
24
|
PublisherName |
National Standards Authority of Ireland
|
Status |
Current
|
Supersedes |
Standards | Relationship |
UNE-EN 60749-11:2003 | Identical |
DIN EN 60749-11:2003-04 | Identical |
NF EN 60749-11 : 2002 | Identical |
BS EN 60749-11:2002 | Identical |
NBN EN 60749-11 : 2003 | Identical |
EN 60749-11:2002 | Identical |
IEC 60749-11:2002 | Identical |
IEC 60749-3:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination |
EN 60749-3:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
EN 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.