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I.S. EN 60749-11:2002

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 11: RAPID CHANGE OF TEMPERATURE - TWO-FLUID-BATH METHOD

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2002

Preview

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

£28.24
Excluding VAT

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Annex ZA (normative) - Normative references to international
         publications with their corresponding European
         publications

Specifies the rapid change of temperature test method and the two-fluid-bath method. Also applicable to all semiconductor devices.

DevelopmentNote
Supersedes I.S. EN 60749. NSAI reissued 2002 PDF dated 19.02.2015 with IEC Corrigenda incorporated. (06/2017)
DocumentType
Standard
Pages
24
PublisherName
National Standards Authority of Ireland
Status
Current
Supersedes

Standards Relationship
UNE-EN 60749-11:2003 Identical
DIN EN 60749-11:2003-04 Identical
NF EN 60749-11 : 2002 Identical
BS EN 60749-11:2002 Identical
NBN EN 60749-11 : 2003 Identical
EN 60749-11:2002 Identical
IEC 60749-11:2002 Identical

IEC 60749-3:2017 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
EN 60749-3:2017 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
EN 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature

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