I.S. EN 140400:2004

1 General
  1.1 Scope
  1.2 Information to be specified in the detail specification
2 Preferred characteristics, ratings and severities for
  environmental and overload tests
  2.1 Preferred characteristics
      2.1.1 Style and dimensions
      2.1.2 Preferred climatic categories
      2.1.3 Temperature characteristics and temperature
            coefficients of resistance
      2.1.4 Limits of change of resistance
  2.2 Preferred values of ratings
      2.2.1 Rated resistance
      2.2.2 Tolerances on rated resistance
      2.2.3 Rated dissipation (in the mounted state)
      2.2.4 Limiting element voltage
      2.2.5 Insulation resistance (insulated styles only)
      2.2.6 Insulation voltage (insulated styles only)
      2.2.7 Combinations of tolerance on rated resistance
            and temperature coefficient
  2.3 Preferred test severities for environmental and
      overload tests
      2.3.1 Drying
      2.3.2 Overload (in the mounted state)
      2.3.3 Mounting of components
3 Quality assessment procedures
  3.1 General
      3.1.1 Structurally similar components
      3.1.2 Formation of inspection lots
  3.2 Qualification approval on the basis of the fixed
      sample size procedure
  3.3 Quality conformance inspection
  3.4 Technology approval
  3.5 Assessed process average procedures
  3.6 Delayed delivery
Annex A (normative) Fixed sample size qualification
        approval and quality conformance inspection test
        schedule for fixed low power surface mount (SMD)
        resistors
Annex B (informative) Letter symbols and abbreviations
Annex C (normative) Standards referred to in this detail
        specification

Applies to fixed low power surface mounting (chip) resistors.