EN 62761:2014
Current
The latest, up-to-date edition.
Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
23-05-2014
IEC 62761:2014-02(en-fr) gives the measurement method for nonlinear signals generated in the radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices such as filters and duplexers, which are used in telecommunications, measuring equipment, radar systems and consumer products. It includes basic properties of non-linearity, and guidelines to setup the measurement system and to establish the measurement procedure of nonlinear signals generated in SAW/BAW devices.
| Committee |
CLC/SR 49
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62761:2014 | Identical |
| NF EN 62761 : 2014 | Identical |
| NBN EN 62761 : 2014 | Identical |
| NEN EN IEC 62761 : 2014 | Identical |
| I.S. EN 62761:2014 | Identical |
| PN EN 62761 : 2014 | Identical |
| UNE-EN 62761:2014 | Identical |
| BS EN 62761:2014 | Identical |
| CEI EN 62761 : 2015 | Identical |
| DIN EN 62761:2014-12 | Identical |
| PNE-FprEN 62761 | Identical |
| EN 62604-1:2015 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification |
| I.S. EN 62604-1:2015 | SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| BS EN 62604-1:2015 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification |
| IEC TS 61994-1:2007 | Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators |
| IEC 62575-2:2012 | Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use |
| IEC 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
| IEC 62047-7:2011 | Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection |
| IEC TS 61994-2:2011 | Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters |
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