EN 60758:2016
Current
The latest, up-to-date edition.
Synthetic quartz crystal - Specifications and guidelines for use
23-09-2016
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Specification for synthetic quartz crystal
5 Specification for lumbered synthetic quartz crystal
6 Inspection rule for synthetic quartz crystal and
lumbered synthetic quartz crystal
7 Guidelines for the use of synthetic quartz crystal for
piezoelectric applications
Annex A (informative) - Frequently used sampling
Procedures
Annex B (informative) - Numerical example
Annex C (informative) - Example of reference sample
selection
Annex D (informative) - Explanations of point callipers
Annex E (informative) - Infrared absorbance Alpha value
compensation
Annex F (informative) - Differences of the orthogonal
axial system for quartz between IEC standard and
IEEE standard
Annex G (informative) - Alpha value measurement
consistency between dispersive infrared
spectrometer and fourier transform infrared
spectrometer
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
IEC 60758:2008(E) applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control and selection. This fourth edition cancels and replaces the third edition, published in 2004. This edition constitutes a technical revision. It includes the following significant technical changes with respect to the previous edition: preparation of AT-cut slice sample for etching is changed to make it easier; etch channel grade classification is changed considering request of the user and explanation of quartz axes difference between IEEE and IEC is added as Annex F.
Committee |
CLC/SR 49
|
DocumentType |
Standard
|
PublisherName |
European Committee for Standards - Electrical
|
Status |
Current
|
Standards | Relationship |
NF EN 60758 : 2013 | Identical |
IEC 60758:2016 | Identical |
NBN EN 60758 : 2016 | Identical |
NEN EN IEC 60758 : 2016 | Identical |
I.S. EN 60758:2016 | Identical |
PN EN 60758 : 2016 | Identical |
SN EN 60758:2016 | Identical |
UNE-EN 60758:2016 | Identical |
BS EN 60758:2016 | Identical |
CEI EN 60758 : 2010 | Identical |
DIN EN 60758:2013-06 (Draft) | Identical |
PNE-FprEN 60758 | Identical |
CEI EN 62276 : 2013 | SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS |
BS EN 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods |
I.S. EN 62276:2016 | SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS |
EN 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
ISO 15368:2001 | Optics and optical instruments Measurement of reflectance of plane surfaces and transmittance of plane parallel elements |
EN 60068-1:2014 | Environmental testing - Part 1: General and guidance |
IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
IEC 60122-2:1983 | Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection |
IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
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