EN 60749 : 99 AMD 2 2001
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
01-06-2003
EN 60749-9:2017
EN 60749-10:2002
EN 60749-11:2002
EN 60749-12:2002
EN 60749-13:2002
EN 60749-14:2003
EN 60749-31:2003
EN 60749-1:2003
EN 60749-2:2002
12-01-2013
Chapter 1: General
1 Scope and object
2 Normative references
3 Terms, definitions and letter symbols
4 Standard atmospheric conditions
5 External visual examination and verification of dimensions
6 Electrical measurements
Chapter 2: Mechanical test methods
1 Robustness of terminations
1.1 Tensile
1.2 Bending
1.3 Torsion
1.4 Torque
2 Soldering
2.1 Solderability
2.2 Resistance to soldering heat
2.3 Resistance of plastic encapsulated SMDs to the
combined effect of moisture and soldering heat
3 Vibration (sinusoidal)
4 Shock
5 Acceleration, steady state
6 Bond strength test
6.1 General
6.2 Methods A and B
6.3 Method C
6.4 Method D
6.5 Methods E and F
6.6 Method G: Wire ball shear test
6.7 Information to be given in the relevant specification
7 Die shear strength test
7.1 Object
7.2 Description of the test apparatus
7.3 Test method
7.4 Failure criteria
7.5 Requirements
7.6 Information to be given in the relevant
specification
Chapter 3: Climatic Test Methods
1 Change of temperature
1.1 Rapid change of temperature: two-chamber method
1.2 Rapid change of temperature: two-fluid-bath method
2 Storage (at high temperature)
3 Low air pressure
4A Damp heat, steady state
4B Damp heat, steady state, accelerated
4C Damp heat, steady state, highly accelerated
5 Sealing
5.1 General terms
5.2 Bomb pressure test
5.3 Fine leak detection: radioactive krypton method
5.4 Fine leak detection: tracer gas method with mass spectrometer
5.5 Gross leak, perfluorocarbon vapour method using electronic
detection apparatus
5.6 Gross leak - perfluorocarbon - bubble detection method
5.7 Test condition E, weight-gain gross-leak detection
5.8 Penetrant dye gross leak detection
5.9 Gross leak re-tests
6 Salt mist
7 Thermal intermittence test
8 Internal moisture content measurement by mass
spectrometry method
8.1 Object
8.2 General description
8.3 Test apparatus
8.4 Preconditioning
8.5 Conditioning
8.6 Requirements
8.7 Information to be given in the relevant specification
8.8 Guidance
Chapter 4: Miscellaneous Test Methods
1 Flammability tests of plastic-encapsulated devices
1.1 Flammability (internally induced)
1.2 Flammability (externally induced)
2 Permanence of marking
Annex A (normative) Guidance
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Defines test methods to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Additional test methods may be required for non-cavity devices.
Committee |
SR 47
|
DocumentType |
Standard
|
PublisherName |
European Committee for Standards - Electrical
|
Status |
Superseded
|
SupersededBy |
Standards | Relationship |
NF EN 60749 : 99 AMD 2 2002 | Identical |
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Identical |
NBN EN 60749 : 99 AMD 2 2002 | Identical |
NEN EN IEC 60749 : 99 AMD 2 2002 | Identical |
I.S. EN 60749:1944 | Identical |
PN EN 60749 : 2003 | Identical |
SN EN 60749 : 1999 AMD 1 2000 | Identical |
UNE EN 60749 : 2000 A2 2002 | Identical |
BS EN 60749:1999 | Identical |
CEI EN 60749 : 2000 AMD 2 2004 | Identical |
DIN EN 60749:2002-09 | Identical |
EN 61643-321:2002 | Components for low-voltage surge protective devices - Part 321: Specifications for Avalanche Breakdown Diode (ABD) |
CEI EN 61643-341 : 2002 | COMPONENTS FOR LOW-VOLTAGE SURGE PROTECTIVE DEVICES - PART 341: SPECIFICATION FOR THYRISTOR SURGE SUPPRESSOR (TSS) |
CEI EN 61643-321 : 2003 | COMPONENTS FOR LOW-VOLTAGE SURGE PROTECTIVE DEVICES - PART 321: SPECIFICATIONS FOR AVALANCHE BREAKDOWN DIODE (ABD) |
CEI EN 61747-1 : 2004 | LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 1: GENERIC SPECIFICATION |
I.S. EN 61760-1:2006 | SURFACE MOUNTING TECHNOLOGY - PART 1: STANDARD METHOD FOR THE SPECIFICATION OF SURFACE MOUNTING COMPONENTS (SMDS) |
OVE/ONORM EN 61760-1 : 2006 | SURFACE MOUNTING TECHNOLOGY - PART 1: STANDARD METHOD FOR THE SPECIFICATION OF SURFACE MOUNTING COMPONENTS (SMDS) |
BS EN 61192-4:2003 | Workmanship requirements for soldered electronic assemblies Terminal assemblies |
EN 61643-341:2001 | Components for low-voltage surge protective devices - Part 341: Specification for thyristor surge suppressors (TSS) |
OVE/ONORM EN 61760-2 : 2007 | SURFACE MOUNTING TECHNOLOGY - PART 2: TRANSPORTATION AND STORAGE CONDITIONS OF SURFACE MOUNTING DEVICES (SMD) - APPLICATION GUIDE |
BS EN 61643-321:2002 | Low voltage surge protective devices Specifications for avalanche breakdown diode (ABD) |
BS EN 61643-341:2001 | Low voltage surge protective devices Specification for thyristor surge suppressors (TSS) |
I.S. EN 61192-4:2003 | WORKMANSHIP REQUIREMENTS FOR SOLDERED ELECTRONIC ASSEMBLIES - TERMINAL ASSEMBLIES |
EN 61192-4:2003 | Workmanship requirements for soldered electronic assemblies - Part 4: Terminal assemblies |
IEC 60653:1979 | General considerations on ultrasonic cleaning |
HD 323.2.11 : 200S1 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST KA: SALT MIST |
HD 323.2.20 : 200S3 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
HD 323.2.13 : 200S1 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST M: LOW AIR PRESSURE |
IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60068-2-13:1983 | Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
EN 60068-1:2014 | Environmental testing - Part 1: General and guidance |
IEC 60068-2-11:1981 | Basic environmental testing procedures - Part 2-11: Tests - Test Ka: Salt mist |
HD 323.2.14 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE |
EN 60068-2-7:1993 | Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state |
HD 323.2.48 : 200S1 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - GUIDANCE ON THE APPLICATION OF THE TESTS OF IEC PUBLICATION 68 TO SIMULATE THE EFFECTS OF STORAGE |
HD 323.2.3 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE |
IEC 60068-2-47:2005 | Environmental testing - Part 2-47: Test - Mounting of specimens for vibration, impact and similar dynamic tests |
IEC 60068-2-3:1969 | Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
EN 60068-2-17:1994 | Environmental testing - Part 2: Tests - Test Q: Sealing |
IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
EN 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
EN 60068-2-6:2008 | Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) |
IEC 60748-1:2002 | Semiconductor devices - Integrated circuits - Part 1: General |
IEC 60068-2-48:1982 | Environmental testing - Part 2: Tests. Guidance on the application of the tests of IEC 68 to simulate the effects of storage |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
EN 60068-2-45:1992/A1:1993 | Environmental testing - Part 2: Tests - Test Xa and guidance: Immersion in cleaning solvents |
EN 60695-2-2:1994/A1:1995 | FIRE HAZARD TESTING - TEST METHODS - NEEDLE-FLAME TEST |
EN 60068-2-47:2005 | Environmental testing - Part 2-47: Tests - Mounting of specimens for vibration, impact and similar dynamic tests |
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