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EN 60747-5-3:2001/A1:2002

Current

Current

The latest, up-to-date edition.

DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-3: OPTOELECTRONIC DEVICES - MEASURING METHODS

Amendment of

EN 60747-5-3:2001

Published date

24-05-2002

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Foreword
1 Scope
2 Normative references
3 Measuring methods for photoemitters
  3.1 Luminous intensity of light-emitting diodes (I[v])
  3.2 Radiant intensity of infrared-emitting diodes (I[e])
  3.3 Peak-emission wavelength (lambda[p]), spectral
       radiation bandwidth (deltalambda), and number of
       longitudinal modes (n[m])
  3.4 Emission source length and width and astigmatism
       of a laser diode without pigtail
  3.5 Half-intensity angle and misalignment angle of
       a photoemitter
4 Measuring methods for photosensitive devices
  4.1 Reverse current under optical radiation of
       photodiodes including devices with or without
       pigtails (I[R(H)] or I[R(E)]), and collector
       current under optical radiation of phototransistors
       (I[C(H)] or I[C(E)])
  4.2 Dark current for photodiodes I[R] and dark currents
       for phototransistors I[CEO], I[ECO], I[EBO]
  4.3 Collector-emitter saturation voltage V[CE(sat)] of
       phototransistors
5 Measuring methods for photocouplers
  5.1 Current transfer ratio (h[F(ctr)])
  5.2 Input-to-output capacitance (C[io])
  5.3 Isolation resistance between input and output
       (r[IO])
  5.4 Isolation test
  5.5 Partial discharges of photocouplers
  5.6 Collector-emitter saturation voltage V[CE(sat)] of
       a photocoupler
  5.7 Switching times t[on], t[off] of a photocoupler
  5.8 Peak off-state current (I[DRM])
  5.9 Peak on-state voltage (V[TM])
  5.10 DC off-state current (I[BD])
  5.11 DC on-state voltage (V[T])
  5.12 Holding current (I[H])
  5.13 Critical rate of rise of off-state voltage (dV/dt)
  5.14 Trigger input current (I[FT])
  5.15 Testing methods of electrical rating for
       phototriac coupler
Annex A (informative) Cross references index

Defines the measuring methods that applies to the optoelectronic devices, which are not intended to be used in the fibre optic systems or subsystems.

Committee
SR 47E
DevelopmentNote
To be read in conjunction with IEC 60747-1, EN 62007-1 and EN 62007-2 (02/2003)
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Current
Supersedes

EN 81-41:2010 Safety rules for the construction and installation of lifts - Special lifts for the transport of persons and goods - Part 41: Vertical lifting platforms intended for use by persons with impaired mobility
EN 60747-5-2:2001/A1:2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS
BS EN 81-41:2010 Safety rules for the construction and installation of lifts. Special lifts for the transport of persons and goods Vertical lifting platforms intended for use by persons with impaired mobility
BS EN 60747-5-2:2001 Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
BS EN 60747-5-5 : 2011 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-5: OPTOELECTRONIC DEVICES - PHOTOCOUPLERS
I.S. EN 81-41:2010 SAFETY RULES FOR THE CONSTRUCTION AND INSTALLATION OF LIFTS - SPECIAL LIFTS FOR THE TRANSPORT OF PERSONS AND GOODS - PART 41: VERTICAL LIFTING PLATFORMS INTENDED FOR USE BY PERSONS WITH IMPAIRED MOBILITY
CEI EN 60747-5-2 : 2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS
12/30258453 DC : 0 BS EN 62368-1 AMD - AUDIO/VIDEO, INFORMATION AND COMMUNICATION TECHNOLOGY EQUIPMENT - PART 1: SAFETY REQUIREMENTS
IEC 60747-5-2:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
EN 60747-5-5:2011/A1:2015 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-5: OPTOELECTRONIC DEVICES - PHOTOCOUPLERS (IEC 60747-5-5:2007/A1:2013)

IEC 60270:2000+AMD1:2015 CSV High-voltage test techniques - Partial discharge measurements
IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
EN 60068-1:2014 Environmental testing - Part 1: General and guidance
IEC 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General

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