EN 60747-5-3:2001/A1:2002
Current
The latest, up-to-date edition.
DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-3: OPTOELECTRONIC DEVICES - MEASURING METHODS
24-05-2002
Foreword
1 Scope
2 Normative references
3 Measuring methods for photoemitters
3.1 Luminous intensity of light-emitting diodes (I[v])
3.2 Radiant intensity of infrared-emitting diodes (I[e])
3.3 Peak-emission wavelength (lambda[p]), spectral
radiation bandwidth (deltalambda), and number of
longitudinal modes (n[m])
3.4 Emission source length and width and astigmatism
of a laser diode without pigtail
3.5 Half-intensity angle and misalignment angle of
a photoemitter
4 Measuring methods for photosensitive devices
4.1 Reverse current under optical radiation of
photodiodes including devices with or without
pigtails (I[R(H)] or I[R(E)]), and collector
current under optical radiation of phototransistors
(I[C(H)] or I[C(E)])
4.2 Dark current for photodiodes I[R] and dark currents
for phototransistors I[CEO], I[ECO], I[EBO]
4.3 Collector-emitter saturation voltage V[CE(sat)] of
phototransistors
5 Measuring methods for photocouplers
5.1 Current transfer ratio (h[F(ctr)])
5.2 Input-to-output capacitance (C[io])
5.3 Isolation resistance between input and output
(r[IO])
5.4 Isolation test
5.5 Partial discharges of photocouplers
5.6 Collector-emitter saturation voltage V[CE(sat)] of
a photocoupler
5.7 Switching times t[on], t[off] of a photocoupler
5.8 Peak off-state current (I[DRM])
5.9 Peak on-state voltage (V[TM])
5.10 DC off-state current (I[BD])
5.11 DC on-state voltage (V[T])
5.12 Holding current (I[H])
5.13 Critical rate of rise of off-state voltage (dV/dt)
5.14 Trigger input current (I[FT])
5.15 Testing methods of electrical rating for
phototriac coupler
Annex A (informative) Cross references index
Defines the measuring methods that applies to the optoelectronic devices, which are not intended to be used in the fibre optic systems or subsystems.
Committee |
SR 47E
|
DevelopmentNote |
To be read in conjunction with IEC 60747-1, EN 62007-1 and EN 62007-2 (02/2003)
|
DocumentType |
Standard
|
PublisherName |
European Committee for Standards - Electrical
|
Status |
Current
|
Supersedes |
Standards | Relationship |
BS EN 60747-5-3:2001 | Identical |
UNE-EN 60747-5-3:2001/A1:2002 | Identical |
NF EN 60747-5-3 : 2001 AMD 1 2002 | Identical |
NEN EN IEC 60747-5-3 : 2001 AMD 1 2002 | Identical |
IEC 60747-5-3:1997+AMD1:2002 CSV | Identical |
SN EN 60747-5-3 : 2001 | Identical |
DIN EN 60747-5-3 : 2003 | Identical |
I.S. EN 60747-5-3:2001 | Identical |
VDE 0884-3 : 2003 | Identical |
PN EN 60747-5-3 : 2008 | Identical |
CEI EN 60747-5-3 : 2002 | Identical |
NBN EN 60747 5-3 : 2002 AMD 1 2002 | Identical |
EN 81-41:2010 | Safety rules for the construction and installation of lifts - Special lifts for the transport of persons and goods - Part 41: Vertical lifting platforms intended for use by persons with impaired mobility |
EN 60747-5-2:2001/A1:2002 | DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS |
BS EN 81-41:2010 | Safety rules for the construction and installation of lifts. Special lifts for the transport of persons and goods Vertical lifting platforms intended for use by persons with impaired mobility |
BS EN 60747-5-2:2001 | Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics |
BS EN 60747-5-5 : 2011 | SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-5: OPTOELECTRONIC DEVICES - PHOTOCOUPLERS |
I.S. EN 81-41:2010 | SAFETY RULES FOR THE CONSTRUCTION AND INSTALLATION OF LIFTS - SPECIAL LIFTS FOR THE TRANSPORT OF PERSONS AND GOODS - PART 41: VERTICAL LIFTING PLATFORMS INTENDED FOR USE BY PERSONS WITH IMPAIRED MOBILITY |
CEI EN 60747-5-2 : 2002 | DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS |
12/30258453 DC : 0 | BS EN 62368-1 AMD - AUDIO/VIDEO, INFORMATION AND COMMUNICATION TECHNOLOGY EQUIPMENT - PART 1: SAFETY REQUIREMENTS |
IEC 60747-5-2:1997+AMD1:2002 CSV | Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics |
EN 60747-5-5:2011/A1:2015 | SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-5: OPTOELECTRONIC DEVICES - PHOTOCOUPLERS (IEC 60747-5-5:2007/A1:2013) |
IEC 60270:2000+AMD1:2015 CSV | High-voltage test techniques - Partial discharge measurements |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
IEC 62007-1:2015 | Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics |
EN 60068-1:2014 | Environmental testing - Part 1: General and guidance |
IEC 62007-2:2009 | Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
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