EN 60512-6-2:2002
Current
The latest, up-to-date edition.
Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump
17-04-2002
Foreword
1 General
2 Preparation of the specimen
3 Test method
4 Measurements
5 Details to be specified
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Defines a standard test method to assess the ability of components (essentially connectors) to withstand specified severities of bump.
| Committee |
CLC/SR 48B
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Standards | Relationship |
| PN EN 60512-6-2 : 2006 | Identical |
| I.S. EN 60512-6-2:2002 | Identical |
| BS EN 60512-6-2:2002 | Identical |
| DIN EN 60512-6-2:2003-01 | Identical |
| UNE-EN 60512-6-2:2002 | Identical |
| NBN EN 60512 6-2 : 2002 | Identical |
| NEN EN IEC 60512-6-2 : 2002 | Identical |
| IEC 60512-6-2:2002 | Identical |
| NF EN 60512-6-2 : 2002 | Identical |
| CEI EN 60512-6-2 : 2003 | Identical |
| CEI EN 50173-1 : 2011 | INFORMATION TECHNOLOGY - GENERIC CABLING SYSTEMS - PART 1: GENERAL REQUIREMENTS |
| BS EN 50173-1:2011 | Information technology. Generic cabling systems General requirements |
| EN 50173-1:2011 | Information technology - Generic cabling systems - Part 1: General requirements |
| I.S. EN 50173-1:2011 | INFORMATION TECHNOLOGY - GENERIC CABLING SYSTEMS - PART 1: GENERAL REQUIREMENTS |
| IEC 60512-7:1993 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests |
| IEC 60512-2-5:2003 | Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests - Test 2e: Contact disturbance |
| IEC 60512-1-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination |
| IEC 60512-2-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method |
| EN 60068-2-29:1993 | Environmental testing - Part 2: Tests - Test Eb and guidance: Bump |
| IEC 60068-2-29:1987 | Environmental testing. Part 2: Tests. Test Eb and guidance: Bump |
| EN 60512-1-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination |
| EN 60512-2-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method |
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