EN 15979:2011
Current
The latest, up-to-date edition.
Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by OES by DC arc excitation
26-01-2011
Foreword
1 Scope
2 Principle
3 Spectrometry
4 Apparatus
5 Reagents
6 Sampling and preparation of test samples
7 Calibration
8 Procedure
9 Calculation
10 Expression of results
11 Precision
12 Test report
Annex A (informative) - Results of inter-laboratory study
Annex B (informative) - Wavelength and working range
Annex C (informative) - Possible interferences and their
elimination
Annex D (informative) - Information regarding the evaluation of
the uncertainty of the mean value
Annex E (informative) - Commercial certified reference materials
Bibliography
This European Standard describes the method for the analysis of mass fractions of the impurities Al, B, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powder and grain-shaped silicon carbide of ceramic raw and basic materials. This application can also be extended to other metallic elements and other similar non-metallic powder and grain-shaped materials such as carbides, nitrides, graphite, carbon blacks, cokes, carbon, as well as a number of further oxidic raw and basic materials after appropriate testing. NOTEThere are positive interferences for materials such as e.g. graphite, B4C, BN, WC and several refractory metal oxides.This testing procedure is applicable to mass fractions of the impurities mentioned above from approximately 1 mg/kg up to approximately 3 000 mg/kg, after verification. In some cases it may be possible to extend the range up to 5 000 mg/kg depending on element, wavelength, arc parameter, and sample weight.
Committee |
CEN/TC 187
|
DevelopmentNote |
Supersedes PREN 15979. (08/2011)
|
DocumentType |
Standard
|
PublisherName |
Comite Europeen de Normalisation
|
Status |
Current
|
Supersedes |
Standards | Relationship |
NEN EN 15979 : 2011 | Identical |
I.S. EN 15979:2011 | Identical |
PN EN 15979 : 2011 | Identical |
UNI EN 15979 : 2011 | Identical |
BS EN 15979:2011 | Identical |
NS EN 15979 : 2011 | Identical |
NF EN 15979 : 2011 | Identical |
NBN EN 15979 : 2011 | Identical |
DIN EN 15979:2011-04 | Identical |
SN EN 15979:2011 | Identical |
UNE-EN 15979:2011 | Identical |
PNE-prEN 15979 | Identical |
UNI EN ISO 1927-3 : 2013 | MONOLITHIC (UNSHAPED) REFRACTORY PRODUCTS - PART 3: CHARACTERIZATION AS RECEIVED |
BS EN ISO 1927-3:2012 | Monolithic (unshaped) refractory products Characterization as received |
DIN EN ISO 1927-3:2013-03 | MONOLITHIC (UNSHAPED) REFRACTORY MATERIALS - PART 3: CHARACTERIZATION AS RECEIVED (ISO 1927-3:2012) |
EN ISO 1927-3:2012 | Monolithic (unshaped) refractory products - Part 3: Characterization as received (ISO 1927-3:2012) |
17/30327875 DC : DRAFT JAN 2017 | BS ISO 16169 - PREPARATION OF SILICON CARBIDE AND SIMILAR MATERIALS FOR ANALYSIS BY ISO 12677 X-RAY FLUORESCENCE (XRF) - FUSED CAST-BEAD METHOD |
I.S. EN ISO 1927-3:2012 | MONOLITHIC (UNSHAPED) REFRACTORY PRODUCTS - PART 3: CHARACTERIZATION AS RECEIVED (ISO 1927-3:2012) |
ISO 1927-3:2012 | Monolithic (unshaped) refractory products — Part 3: Characterization as received |
ISO 5022:1979 | Shaped refractory products — Sampling and acceptance testing |
EN ISO 21068-1:2008 | Chemical analysis of silicon-carbide-containing raw materials and refractory products - Part 1: General information and sample preparation (ISO 21068-1:2008) |
ISO 5725-4:1994 | Accuracy (trueness and precision) of measurement methods and results Part 4: Basic methods for the determination of the trueness of a standard measurement method |
ISO 21068-1:2008 | Chemical analysis of silicon-carbide-containing raw materials and refractory products — Part 1: General information and sample preparation |
ISO 5725-2:1994 | Accuracy (trueness and precision) of measurement methods and results Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method |
ISO 8656-1:1988 | Refractory products — Sampling of raw materials and unshaped products — Part 1: Sampling scheme |
ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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