EN 153000:1998
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval)
25-04-2018
27-04-1998
1 General
2 Quality assessment procedures
3 Test and measurement procedures (general guidance)
Annex A General inspection requirements for rectifier
diodes and thyristors
Annex B Additional electrical test methods
Annex C Screening
Annex D Dimensions
Annex E Direction of applied forces for mechanical tests
Figures
This document applies to discrete pressure contact power semiconductor devices namely rectifier diodes, transistors, thyristors and their derivatives. The requirements also cover encapsulated assemblies. The document does not apply to stacks or assemblies made with these encapsulated components.
| Committee |
CLC/SR 47E
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Withdrawn
|
| Standards | Relationship |
| I.S. EN 153000:1998 | Identical |
| NEN EN 153000 : 1998 | Identical |
| BS EN 153000:1998 | Identical |
| CEI EN 153000 : 1999 | Identical |
| SN EN 153000 : 1998 | Identical |
| UNE-EN 153000:1998 | Identical |
| PN EN 153000 : 2005 | Identical |
| DIN EN 153000:1999-01 | Identical |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| ISO 8601:2004 | Data elements and interchange formats Information interchange Representation of dates and times |
| EN 100114-1 : 1996 | RULE OF PROCEDURE - QUALITY ASSESSMENT PROCEDURES - PART 1: CECC REQUIREMENTS FOR THE APPROVAL OF AN ORGANIZATION |
| IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
| IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
| CECC 00111 : 80 AMD 3 | CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY |
| ISO 2015:1976 | Numbering of weeks |
| ISO 497:1973 | Guide to the choice of series of preferred numbers and of series containing more rounded values of preferred numbers |
| IEC 60148:1969 | Letter symbols for semiconductor devices and integrated microcircuits |
| IEC 60747-6:2016 | Semiconductor devices - Part 6: Discrete devices - Thyristors |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| CECC 00007 : 1978 | BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES |
| IEC 60747-2:2016 | Semiconductor devices - Part 2: Discrete devices - Rectifier diodes |
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