EN 13925-2:2003

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Specimen preparation
  4.1 General preparation
  4.2 Block specimens
  4.3 Powder specimens
  4.4 Analysis of small quantities of sample
  4.5 Reactive samples and non-ambient conditions
5 Data collection
  5.1 General considerations
  5.2 Angular range and mode of data collection
  5.3 Parameters relevant to the quality of collected data
6 Data processing and analysis
  6.1 Background
  6.2 Peal searching
  6.3 Pattern decomposition into individual line profiles
      including background subtraction
  6.4 Phase identification
  6.5 Indexing
  6.6 Lattice parameter refinement
  6.7 Other types of analysis
Annex A (informative) Relationship between the XRPD standards
Annex B (informative) Example of Report Form
Annex C (informative) Scheme of a typical procedure for
        XRPD measurements
Annex D (informative) Some analytical functions used for
        profile fitting
Annex E (informative) Some methods for testing the internal
        consistency of XRPD data
        E.1 General
        E.2 Figures of Merit for FWHMs and intensities
        E.3 Figures of Merit for line positions and lattice
            parameters
Bibliography

This standard outlines the basic procedures applied in the X-ray Powder Diffraction (XRPD) method. Many of these procedures are common to most types of diffractometer used and type of analysis mentionen in prEN WI 00138079 (General Principles). In the interests of clarity and immediate usability more detail is given for procedures using instruments with Bragg-Brentano geometry and application to phase identification. Aspects of specimen preparation and data quality assessment are included, but the standard remains non-exhaustive.