DIN EN ISO-IEC 15416 E : 2002

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms
  4.1 Abbreviations
  4.2 Symbols
5 Measurement methodology
  5.1 General requirements
  5.2 Reference reflectivity measurements
      5.2.1 Measurement wavelength(s)
      5.2.2 Measuring aperture
      5.2.3 Optical geometry
      5.2.4 Inspection band
      5.2.5 Number of scans
  5.3 Scan reflectance profile
  5.4 Scan reflectance profile assessment parameters
      5.4.1 Element determination
      5.4.2 Edge determination
      5.4.3 Decode
      5.4.4 Symbol contrast (SC)
      5.4.5 Minimum reflectance (R[min])
      5.4.6 Edge contrast (EC)
      5.4.7 Modulation (MOD)
      5.4.8 Defects
      5.4.9 Decodability
      5.4.10 Quiet zone check
6 Symbol grading
  6.1 Scan reflectance profile grading
      6.1.1 Decode
      6.1.2 Reflectance parameter grading
      6.1.3 Decodability
  6.2 Expression of symbol grade
7 Substrate characteristics
Annex A (normative) Decodability
      A.1 Two-width symbologies
      A.2 Edge to similar edge decodable symbologies
          ((n,k) symbologies)
Annex B (normative) Example of symbol quality grading
      B.1 Individual scan reflectance profile grading
      B.2 Overall symbol grade
Annex C (informative) Symbol grading flowchart
Annex D (informative) Substrate characteristics
      D.1 Substrate opacity
      D.2 Gloss
      D.3 Over-laminate
      D.4 Static reflectance measurements
          D.4.1 Prediction of Symbol contrast (SC)
          D.4.2 Prediction of Minimum edge contrast (EC[min])
                and Modulation (MOD)
          D.4.3 Acceptability of measured and derived values
Annex E (informative) Interpretation of the scan reflectance
                      profile and profile grades
      E.1 Significance of scan reflectance profiles
      E.2 Interpretation of results
      E.3 Matching grades to applications
      E.4 Alphabetic grading
Annex F (informative) Guidance on selection of light wavelength
      F.1 Light sources
      F.2 Effect of variations in wavelength
Annex G (informative) Guidance on number of scans per symbol
Annex H (informative) Example of verification report
Annex I (informative) Comparison with traditional methodologies
      I.1 Traditional methodologies
      I.2 Correction of print contrast signal with symbol
          contrast measurements
      I.3 Guidance on grading for applications also specifying
          PCS
Annex J (informative) Process control requirements
      J.1 Process control for repetitive printing
      J.2 Number of scans
      J.3 Bar width deviation
          J.3.1 Two-width symbologies
          J.3.2 (n,k) symbologies
          J.3.3 Average bar width gain/loss
Bibliography

Specifies the methodology for the measurement of specific attributes of bar code symbols. Defines a method for evaluating these measurements and deriving an overall assessment of symbol quality.