BS IEC 62341-1-1 : 2009
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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ORGANIC LIGHT EMITTING DIODE (OLED) DISPLAYS - PART 1-1: GENERIC SPECIFICATIONS
Hardcopy , PDF
30-06-2010
English
01-01-2009
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FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, units and symbols
4 Technical aspects
4.1 Order of precedence
4.2 Standard atmospheric conditions
4.3 Marking
4.3.1 Device identification
4.3.2 Device traceability
4.3.3 Packing
4.4 Categories of assessed quality
4.5 Screening
4.6 Handling
5 Quality assessment procedures
5.1 Eligibility for qualification approval
5.2 Primary stage of manufacture
5.3 Commercially confidential information
5.4 Formation of inspection lots
5.5 Structurally similar devices
5.6 Subcontracting
5.7 Validity of release
6 Quality approval procedure
6.1 Granting of qualification approval
6.2 Quality conformance inspection requirements
6.2.1 Division into groups and subgroups
6.2.2 Quality conformance Inspection requirements
6.2.3 Supplementary procedure for reduced inspection
6.2.4 Sampling requirements for small lots
6.2.5 Certified records of released lots (CRRL)
6.2.6 Delivery of devices subjected to destructive
or non-destructive test
6.2.7 Delayed deliveries
6.2.8 Supplementary procedure for deliveries
6.3 Statistical sampling procedures
6.3.1 AQL sampling plans
6.3.2 LTPD sampling plans
6.4 Endurance tests
6.4.1 General
6.4.2 Endurance tests where the failure rate is specified
6.5 Accelerated test procedures
7 Capability approval procedure
8 Test and measurement procedures
8.1 Standard environmental conditions
8.1.1 Dark room condition
8.1.2 Standard setup condition
8.1.3 Standard atmospheric conditions for measurements
8.2 Physical examination
8.2.1 Visual examination
8.2.2 Dimensions
8.2.3 Weight
8.2.4 Permanence of marking
8.3 Electrical and optical measurement
8.3.1 General conditions and precautions
8.4 Environmental test
8.5 Endurance test
Annex A (informative) - Lot tolerance percentage defective
(LTPD) sampling plans
Bibliography
Describes general procedures for quality assessment to be used in the IECQ-CECC system and establishes general rules for methods of electrical and optical measurements, environmental and mechanical tests and endurance tests.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 05/30143244 DC. (07/2009) Renumbered and superseded by BS EN 62341-1-1. (06/2010)
|
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| IEC 62341-1-1:2009 | Identical |
| IEC 62341-1-2:2014 | Organic light emitting diode (OLED) displays - Part 1-2: Terminology and letter symbols |
| ISO 1101:2017 | Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out |
| IEC 62341-5:2009 | Organic light emitting diode (OLED) displays - Part 5: Environmental testing methods |
| IEC 60027-1:1992 | Letters symbols to be used in electrical technology - Part 1: General |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| ISO 8601:2004 | Data elements and interchange formats Information interchange Representation of dates and times |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60027-4:2006 | Letter symbols to be used in electrical technology - Part 4: Rotating electric machines |
| IEC 60050-521:2002 | International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits |
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