BS IEC 61586:1997
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Estimation of the reliability of electrical connectors
Hardcopy , PDF
28-02-2017
English
15-08-1997
FOREWORD
INTRODUCTION
1 Scope
2 General considerations
2.1 Intrinsic degradation mechanisms
2.2 Extrinsic degradation mechanisms
2.3 Control of extrinsic degradation
2.4 Failure modes and failure mechanisms
2.5 Degradation mechanisms
3 Test methods and acceleration factors
4 Reliability statistics
5 Acceptance criteria
6 Estimation of the reliability of multi-position
connectors
6.1 Estimation of connector reliability from contact
reliability when the contacts in a connector
perform statistically independently
6.2 Estimation of connector reliability using
asymptotic extreme-value distributions
7 Summary and conclusions
Annexes
A Detailed example of an extreme-value reliability
calculation
B Bibliography
Concerned with the estimating of the reliability of electrical connectors through defining and developing an appropriate accelerated testing programme. Reviews basic intrinsic degradation mechanisms of connectors to give a context for the developing of the desired test programme.
Committee |
EPL/48
|
DevelopmentNote |
Supersedes 93/210022 DC. (06/2005) Reviewed and confirmed by BSI, June 2007. (05/2007)
|
DocumentType |
Standard
|
Pages |
20
|
PublisherName |
British Standards Institution
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
IEC 60863:1986 | Presentation of reliability, maintainability and availability predictions |
MIL-HDBK-217 Revision F:1991 | RELIABILITY PREDICTION OF ELECTRONIC EQUIPMENT |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.