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BS EN 61967-5:2003

Current

Current

The latest, up-to-date edition.

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Workbench Faraday Cage method

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

17-06-2003

£198.00
Excluding VAT

Introduction
1 Scope
2 Normative references
3 Definitions
4 General
  4.1 Measurement philosophy
  4.2 Principle set-up
  4.3 Workbench concept
5 Test conditions
6 Test equipment
7 Test set-up
  7.1 Shielding and ambient fields
  7.2 Workbench set-up
  7.3 Connections to the PCB
  7.4 Common-mode points
      7.4.1 Comparison testing
      7.4.2 Definitive application
  7.5 Emission limits
  7.6 Workbench - Practical implementation
  7.7 Test PCB
8 Test procedure
9 Test report
  9.1 Emission criteria
  9.2 Emission levels
Annex A (informative) Detail specification of Workbench
        Faraday Cage (WBFC)
Annex B (informative) Common-mode impedances
Annex C (informative) Derivation of limits
Annex D (informative) Use of the Workbench
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications
Bibliography
Figures
Tables

Specifies a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB).

Committee
EPL/47
DocumentType
Standard
Pages
28
PublisherName
British Standards Institution
Status
Current

Describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB). Has a high repeatability and a good relationship to the measured RF emission of final applications with the integrated circuits used.

Standards Relationship
EN 61967-5:2003 Identical
NF EN 61967-5 : 2003 Identical
NBN EN 61967-5 : 2004 Identical
I.S. EN 61967-5:2003 Identical
SN EN 61967-5 : 2003 Identical
DIN EN 61967-5:2003-10 Identical
IEC 61967-5:2003 Identical

IEC 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
IEC 60050-131:2002 International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory
MIL-STD-285 Base Document:1956 ATTENUATION MEASUREMENTS FOR ENCLOSURES, ELECTROMAGNETIC SHIELDING, FOR ELECTRONIC TEST PURPOSES, METHOD OF
IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC 61000-4-6:2013 Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
CISPR 16-2:2003 Specification for radio disturbance and immunity measuring apparatus and methods - Part 2: Methods of measurement of disturbances and immunity
IEC 61967-6:2002+AMD1:2008 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
CISPR 16-1:1999+AMD1:2002 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1: Radio disturbance and immunity measuring apparatus

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