BS EN 61747-1:2000
Current
The latest, up-to-date edition.
Liquid crystal and solid-state display devices Generic specification
Hardcopy , PDF
English
31-10-2003
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1 Scope
2 Normative references
3 Terminology
3.1 Physical concepts
3.2 General terms
3.3 Terms related to ratings and characteristics
4 Technical aspects
4.1 Order of precedence
4.2 Terminology, units and symbols
4.3 Preferred values of temperature, humidity and
pressure
4.4 Marking
4.4.1 Device identification
4.4.2 Device traceability
4.4.3 Packing
4.5 Categories of assessed quality
4.6 Screening
4.7 Handling
5 Quality assessment procedures
5.1 Eligibility for qualification approval
5.1.1 Primary stage of manufacture
5.2 Commercially confidential information
5.3 Formation of inspection lots
5.4 Structurally similar devices
5.5 Granting of qualification approval
5.6 Quality conformance inspection
5.6.1 Division into groups and subgroups
5.6.2 Inspection requirements
5.6.3 Supplementary procedure for reduced
inspection
5.6.4 Sampling requirements for small lots
5.6.5 Certified records of released lots
(CRRL)
5.6.6 Delivery of devices subjected to
destructive or non-destructive tests
5.6.7 Delayed deliveries
5.6.8 Supplementary procedure for deliveries
5.7 Statistical sampling procedures
5.7.1 AQL sampling plans
5.7.2 LTPD sampling plans
5.8 Endurance tests
5.9 Endurance tests where the failure rate is
specified
5.9.1 General
5.9.2 Selection of samples
5.9.3 Failure
5.9.4 Endurance test time and sample size
5.9.5 Procedure to be used if the number of
observed failures exceeds the
acceptance number
5.10 Accelerated test procedures
5.11 Capability approval
6 Test and measurement procedures
6.1 Standard atmospheric conditions for electrical
and optical measurements
6.2 Physical examination
6.2.1 Visual examination
6.2.2 Dimensions
6.2.3 Permanence of marking
6.3 Electrical and optical measurements
6.3.1 General conditions and precautions
6.4 Environmental tests
Annex A (informative) Cross references index
Annex B (informative) Example of outline drawings of liquid
crystal display cells
Annex C (normative) Orientation of LCD modules
Annex D (normative) Lot tolerance percentage defective
(LTPD) sampling plans
Tables
Generic specification defining general procedures for quality assessment for IECQ use and general rules for measuring methods of electrical and optical characteristics, climatic and mechanical tests and endurance tests.
| Committee |
EPL/100
|
| DevelopmentNote |
Renumbers and supersedes BS IEC 61747-1. 2000 version incorporates amendment 10788 to BS IEC 61747-1. Also numbered as IEC 61747-1. Supersedes 01/201646 DC & 93/203880 DC. (01/2006)
|
| DocumentType |
Standard
|
| Pages |
46
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| SN EN 61747-1 : 1999 AMD 1 2003 | Identical |
| NF EN 61747-1 : 2000 AMD 1 2003 | Identical |
| EN 61747-1:1999/A1:2003 | Identical |
| DIN EN 61747-1:2003-12 | Identical |
| NBN EN 61747-1 : 2000 AMD 1 2004 | Identical |
| I.S. EN 61747-1:2000 AMD 1 2003 | Identical |
| IEC 61747-3-1:2015 | Liquid crystal display devices - Part 3-1: Liquid crystal display (LCD) cells - Blank detail specification |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 60191-1:2007 | Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices |
| EN 61747-3-1 : 2006 | LIQUID CRYSTAL DISPLAY DEVICES - PART 3-1: LIQUID CRYSTAL DISPLAY (LCD) CELLS - BLANK DETAIL SPECIFICATION |
| EN 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| ISO 2859:1974 | Sampling procedures and tables for inspection by attributes |
| ISO 1101:2017 | Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out |
| EN 60068-1:2014 | Environmental testing - Part 1: General and guidance |
| IEC 61747-2-1:2013 | Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification |
| EN 60749-1:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 1: General |
| EN 61747-4:2012 | Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics |
| IEC 60747-10:1991 | Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
| EN 61747-2-1:2013 | Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification |
| IEC 60747-5:1992 | Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices |
| IEC 60027-1:1992 | Letters symbols to be used in electrical technology - Part 1: General |
| IEC 60191-2:2012 DB | Mechanical standardization of semiconductor devices - Part 2: Dimensions |
| IEC 61747-5:1998 | Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| HD 323.1 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - GENERAL AND GUIDANCE |
| ISO 8601:2004 | Data elements and interchange formats Information interchange Representation of dates and times |
| IEC 60617-1:1985 | Graphical symbols for diagrams. Part 1: General information, general index. Cross-reference tables |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
| IEC 60748-1:2002 | Semiconductor devices - Integrated circuits - Part 1: General |
| IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| IEC 61747-4:2012 | Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics |
| HD 245.1 : 200S3 | LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - GENERAL |
| EN 28601 : 1992 | DATA ELEMENTS AND INTERCHANGE FORMATS - INFORMATION INTERCHANGE - REPRESENTATION OF DATES AND TIMES |
| EN 61747-5:1998 | Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods |
| IEC 60191-3:1999 | Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits |
| HD 323.2.1 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST A: COLD |
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