BS EN 60749-5:2017
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Hardcopy , PDF
06-02-2024
English
20-07-2017
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FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Equipment
6 Test conditions
7 Procedures
8 Failure criteria
9 Safety
10 Summary
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Defines a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 00/203277 DC (10/2004) Supersedes BS EN 60749. (09/2005) Supersedes 16/30348576 DC. (07/2017)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
This part of IEC60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This test method is considered destructive.
| Standards | Relationship |
| NF EN 60749-5 : 2003 | Identical |
| IEC 60749-5:2017 | Identical |
| UNE-EN 60749-5:2003 | Identical |
| NBN EN 60749-5 : 2004 | Identical |
| DIN EN 60749-5:2003-09 | Identical |
| EN 60335-2-9:2003/A13:2010/AC:2011 | Identical |
| SN EN 60749-5 : 2003 | Identical |
| EN 60749-5:2017 | Identical |
| I.S. EN 60749-5:2017 | Identical |
| EN 60749-4:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) |
| IEC 60749-4:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) |
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