BS EN 60444-8:2017
Current
The latest, up-to-date edition.
Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
Hardcopy , PDF
English
26-05-2017
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Specifications
4 Leadless surface mounted quartz crystal units
5 Specifications of measurement method, test fixture
6 Calibration
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Defines test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts).
Committee |
W/-
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DevelopmentNote |
Supersedes BS PD IEC/PAS 62277 and 01/208154 DC (11/2003) Supersedes 13/30283831 DC. (05/2017)
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DocumentType |
Standard
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Pages |
22
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PublisherName |
British Standards Institution
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Status |
Current
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Supersedes |
This part of IEC 60444 describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of (series) resonance frequency, (series) resonance resistance, and equivalent electrical circuit parameters L1, C1 and C0 using the measurement techniques specified in IEC 60444-5 and for the determination of load resonance frequency and load resonance resistance according to IEC TR 60444-4 and IEC 60444-11.
Two test fixtures are described in this document:
A fixture using the π-network circuit with electrical values as described in IEC 60444-1 for measurements in transmission mode up to 500 MHz. This fixture includes optional means to add physical load capacitors for the measurement of load resonance parameters up to 30 MHz in accordance with IEC 60444-4. The range of load capacitance is 10 pF or more. Calibration of the measurement system and CL adapter board is explained hereinafter.
A fixture based on the reflection method, suitable for a frequency range up to 1 200 MHz. No provisions for adding a physical load capacitance are anticipated. Load resonance parameters can be measured by using the method of IEC 60444-11.
Standards | Relationship |
EN 60793-2-50:2008 | Identical |
IEC 60793-2-50:2008 | Identical |
SN EN 60444-8 : 2017 | Identical |
IEC 60444-8:2016 | Identical |
NBN EN 60444-8 : 2003 | Identical |
I.S. EN 60444-8:2017 | Identical |
NF EN 60444-8 : 2017 | Identical |
EN 60444-8:2017 | Identical |
DIN EN 60444-8:2004-03 | Identical |
EN 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
IEC 61837-1:2012 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines |
EN 60444-2:1997 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units |
IEC 60444-5:1995 | Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
IEC 61837-2:2011+AMD1:2014 CSV | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part2: Ceramic enclosures |
IEC 60444-2:1980 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units |
IEC 60444-6:2013 | Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) |
EN 60444-1:1997/A1:1999 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - PART 1: BASIC METHOD FOR THE MEASUREMENT OF RESONANCE FREQUENCY AND RESONANCE RESISTANCE OF QUARTZ CRYSTAL UNITS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK |
IEC 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
EN 60444-6:2013 | Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) |
EN 60444-7:2004 | Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units |
IEC 60444-9:2007 | Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units |
EN 61837-1:2012 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines |
EN 60444-9:2007 | Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units |
IEC 60444-7:2004 | Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units |
IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
EN 60444-5:1997 | Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
EN 61837-2:2011/A1:2014 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES (IEC 61837-2:2011/A1:2014) |
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