BS EN 175100:1993
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components. Sectional specification. Two part and edge socket connectors for printed board applications
Hardcopy , PDF
English
15-06-1993
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Cooperating organizations
National foreword
Foreword
Preface
Section 1. Scope
Section 2. General
2.1 Related documents
2.2 Terminology
2.3 Classification into climatic categories
2.4 Creepage and clearance distances
2.5 Current
2.6 Marking
2.7 Type designation
Section 3. General requirements - test and test
schedules
3.1 Workmanship
3.2 Testing
3.3 Test schedules
Section 4. Preparation of detail specification (DS)
4.1 Title of DS
4.2 Drawing information
4.2.1 Projection method and dimensions system
4.2.2 Drawings and dimensions
4.3 System of lettering
4.4 Contents of DS
Section 5. Quality assessment procedures
5.1 Primary stage of manufacture
5.2 Structurally similar components
5.3 System of levels
5.4 Grouping of tests
5.5 Qualification approval procedure
5.6 Maintenance of qualification approval
5.7 Withdrawal or suspension of qualification
approval
5.8 Significant changes
5.9 Quality conformance inspection
5.10 Test records
5.11 Delivery of tested connectors
5.12 Release for deliveries before the completion of
group B tests
5.13 Delayed delivery
5.14 In-process testing
Section 6. Preparation of detail specifications (DS)
Annex
A Common lettering system to be used on drawings
Tables
1 Qualification approval test schedule
2 Quality conformance inspection schedule
National annex NA (informative) Committees responsible
National annex NB (informative) Cross-references
Establishes specifications and type test requirements and rules for preparation of detail specifications.
| Committee |
EPL/48
|
| DevelopmentNote |
Supersedes BS CECC75100(1984) which remains current. (01/2006)
|
| DocumentType |
Standard
|
| Pages |
38
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| CECC 75100 : 1991 | Identical |
| DIN EN 175100:1993-02 | Identical |
| I.S. EN 175100:1994 | Identical |
| EN 175100 : 1992 | Identical |
| BS 5772-8:1985 | Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods Connector tests (mechanical) and mechanical tests on contacts and terminations |
| BS 5772-4:1979 | Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods Dynamic stress tests |
| BS 6001-1:1991 | Sampling procedures for inspection by attributes Specification for sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection |
| CECC 00100 : 1988 | BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V |
| BS 4727-1:GRP13(1991) : 1991 | GLOSSARY OF ELECTROTECHNICAL, POWER, TELECOMMUNICATION, ELECTRONICS, LIGHTING AND COLOUR TERMS - TERMS COMMON TO POWER, TELECOMMUNICATIONS AND ELECTRONICS - ELECTROMECHANICAL COMPONENTS FOR ELECTRONIC EQUIPMENT |
| CECC 00009 : 1980 | BASIC SPECIFICATION: BASIC TESTING PROCEDURES AND MEASURING METHODS FOR ELECTROMECHANICAL COMPONENTS |
| BS 9000-2:1991 | General requirements for a system for electronic components of assessed quality Specification for the national implementation of the CECC system |
| CECC 00007 : 1978 | BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES |
| CECC 00400 : 86 ERRATUM 92 | HANDBOOK FOR THE PRODUCTION OF CECC DOCUMENTS |
| ISO/R 286:1962 | ISO system of limits and fits Part I : General, tolerances and deviations |
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