BS CECC20001(1991) : 1991 AMD 8000
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: LIGHT EMITTING DIODES, LIGHT EMITTING DIODE ARRAYS, LIGHT EMITTING DIODE DISPLAYS WITHOUT INTEGRAL LOGIC AND RESISTORS
Superseded date
15-10-1993
Superseded by
Published date
06-12-2012
Publisher
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Gives ratings, characteristics and inspection requirements to be included as the minimum mandatory requirements in detail specifications written in accordance with BS CECC 20000. BS AMD 8000 RENUMBERS THIS STANDARD TO BS EN 120001
| Committee |
ECL/24
|
| DevelopmentNote |
Renumbered and superseded by BS EN 120001. Supersedes BS CECC20001(1983). (08/2005)
|
| DocumentType |
Standard
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| CECC 20001 : 1991 | Identical |
| CECC 00100 : 1988 | BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V |
| IEC 60191-2:2012 DB | Mechanical standardization of semiconductor devices - Part 2: Dimensions |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| CECC 20000 : 82 AMD 3 | GENERIC SPECIFICATION: SEMICONDUCTOR OPTOELECTRONIC AND LIQUID CRYSTAL DEVICES |
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